Understanding atom movement during lateral manipulation with the STM tip using a simple simulation method

We report on a fast simulation method to investigate the movement of an atom induced by the tip during lateral manipulation with a scanning tunneling microscope. The simulation is based on a model assuming the atom moving in the combined potential of tip and surface. The pathway of the tip is subdiv...

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Bibliographic Details
Published inSurface science Vol. 499; no. 1; pp. 15 - 23
Main Authors Kühnle, A., Meyer, G., Hla, S.W., Rieder, K.-H.
Format Journal Article
LanguageEnglish
Published Lausanne Elsevier B.V 20.02.2002
Amsterdam Elsevier Science
New York, NY
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Summary:We report on a fast simulation method to investigate the movement of an atom induced by the tip during lateral manipulation with a scanning tunneling microscope. The simulation is based on a model assuming the atom moving in the combined potential of tip and surface. The pathway of the tip is subdivided in small steps, and the atomic position for each step is calculated by an iterative algorithm searching for the closest energetic minimum. The method is demonstrated for manipulation on the (111) surface of an fcc metal. Our model calculations predict which energetic minima of the surface are attained by the atom during manipulation. The details of the modelled manipulation curves allow a precise description of the atomic pathway in dependence on manipulation direction and positioning of the tip relative to the atom. Furthermore, the simulation predicts a transition from the so-called pulling to sliding manipulation mode upon reducing tip–surface distance, well in agreement with general experimental observations. To test our algorithm we present experimental results for the manipulation of iodine on Cu(111) along the [21̄1̄] direction and compare them to simulated manipulation curves. The comparison allows for a complete understanding of all details in atomic movements during manipulation along a complicated path.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0039-6028
1879-2758
DOI:10.1016/S0039-6028(01)01848-9