A Multi-View Deep Learning Framework for EEG Seizure Detection

• Published in: IEEE journal of biomedical and health informatics Vol. 23; no. 1; pp. 83 - 94
• Main Authors: Yuan, Ye, Xun, Guangxu, Jia, Kebin, Zhang, Aidong
• Format: Journal Article
• Language: English
• Published: United States IEEE 01.01.2019; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Abnormalities; Brain; Brain modeling; Channels; Convulsions & seizures; Deep learning; EEG; electroencephalogram; Electroencephalography; Epilepsy; epileptic seizure; Feature extraction; Informatics; Inspection; Machine learning; multi-view learning; Scalp; Seizing; Seizures; Spectrogram

The recent advances in pervasive sensing technologies have enabled us to monitor and analyze the multi-channel electroencephalogram (EEG) signals of epilepsy patients to prevent serious outcomes caused by epileptic seizures. To avoid manual visual inspection from long-term EEG readings, automatic EE...