Stresses and Strains in Anisotropic Cubic Ultra-Thin Overlayers

• Published in: Crystal research and technology (1979) Vol. 36; no. 8-10; pp. 1045 - 1057
• Main Authors: Kunert, H. W., Lavitska, E.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Berlin WILEY-VCH Verlag Berlin GmbH 01.10.2001; WILEY‐VCH Verlag Berlin GmbH; Wiley-VCH
• Subjects: Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Mechanical and acoustical properties; overlayer; Physical properties of thin films, nonelectronic; Physics; stiffness constants; strain; stress; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin films; Ultrathin films; Cubic lattices; Elastic constants; Strain energy; Mechanical properties; Theoretical study; Overlayers; Surface stresses
• ISSN: 0232-1300; 1521-4079
• DOI: 10.1002/1521-4079(200110)36:8/10<1045::AID-CRAT1045>3.0.CO;2-K

The following quantities have been calculated for anisotropic overlayers of cubic crystals: (i) a set of useful stiffness constant transformation relations together with error probes i.e. equations for checking the correctness of the transformed quantities when reduced to isotropic medium, (ii) the transformed stiffness constants, (iii) Hookian relation and strain energy density for fcc {111} ultra‐thin overlayer. A direct application of the calculated quantities to Si {111} overlayer is also discussed.