Domain-wall induced magneto-resistive memory in ferromagnetic (Ga, Mn)As nanostructures

Novel magneto-resistive memory effect is demonstrated, which appears in lithographically patterned Y-shaped, three-terminal nanostructures, consisting of three nanowires joined in one point, formed in the epitaxial layer of a ferromagnetic (Ga,Mn)As semiconductor. The effect, in which the zero-field...

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Published in12th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors,2007-09-09 - 2007-09-13 Vol. 19; no. Suppl 1; pp. 111 - 114
Main Authors Wosinski, Tadeusz, Figielski, Tadeusz, Morawski, Andrzej, Makosa, Andrzej, Osinniy, Viktor, Wrobel, Jerzy, Sadowski, Janusz
Format Journal Article Conference Proceeding
LanguageEnglish
Published Boston Springer US 01.12.2008
Springer
Springer Nature B.V
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Summary:Novel magneto-resistive memory effect is demonstrated, which appears in lithographically patterned Y-shaped, three-terminal nanostructures, consisting of three nanowires joined in one point, formed in the epitaxial layer of a ferromagnetic (Ga,Mn)As semiconductor. The effect, in which the zero-field resistance of a pair of nanowires depends on the direction of the previously applied magnetic field, results from a rearrangement of magnetic domain walls, contributing an extra resistance, between different pairs of nanowires in the structure. Two-state behaviour of the nanostructure resistance provides its usefulness for applications in non-volatile memory devices.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-007-9516-x