Detection of stable positive fixed charges in AlOx activated during annealing with in situ modulated PhotoLuminescence

An in situ Modulated Photoluminescence (MPL) measurement setup mounted on a Plasma Enhanced Chemical Vapor Deposition (PECVD) reactor is described. A method for deriving the actual minority carrier lifetime at the specific injection level of 1.1015 cm−3 is presented. This tool was used in a case stu...

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Published inSolar energy materials and solar cells Vol. 230; p. 111172
Main Authors Desthieux, Anatole, Sreng, Mengkoing, Bulkin, Pavel, Florea, Ileana, Drahi, Etienne, Bazer-Bachi, Barbara, Vanel, Jean-Charles, Silva, François, Posada, Jorge, Roca i Cabarrocas, Pere
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 15.09.2021
Elsevier BV
Elsevier
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Summary:An in situ Modulated Photoluminescence (MPL) measurement setup mounted on a Plasma Enhanced Chemical Vapor Deposition (PECVD) reactor is described. A method for deriving the actual minority carrier lifetime at the specific injection level of 1.1015 cm−3 is presented. This tool was used in a case study to monitor the passivation properties of aluminum oxide (AlOx) thin films upon annealing. Interesting kinetics, such as a drop of lifetime at temperatures higher than 250 °C along with a recovery of the lifetime during the cooling phase, are shown. Moreover, these in situ results combined with ex situ studies allowed us to demonstrate the formation a stable high positive fixed charge density in the AlOx layer (+1.1012 cm−2) as a consequence of the combination of annealing and light exposure. •Description of an in situ Modulated Photo-Luminescence acquisition tool.•Method for measuring the effective lifetime at an injection level of 1.1015 cm−3.•Description of kinetics of passivation of AlOx passivated samples upon annealing.•Observation of the combined action of temperature and light exposure.•Evidencing stable, high positive fixed charges in AlOx (1.1012 cm−2).
ISSN:0927-0248
1879-3398
DOI:10.1016/j.solmat.2021.111172