Detection of stable positive fixed charges in AlOx activated during annealing with in situ modulated PhotoLuminescence
An in situ Modulated Photoluminescence (MPL) measurement setup mounted on a Plasma Enhanced Chemical Vapor Deposition (PECVD) reactor is described. A method for deriving the actual minority carrier lifetime at the specific injection level of 1.1015 cm−3 is presented. This tool was used in a case stu...
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Published in | Solar energy materials and solar cells Vol. 230; p. 111172 |
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Main Authors | , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
15.09.2021
Elsevier BV Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | An in situ Modulated Photoluminescence (MPL) measurement setup mounted on a Plasma Enhanced Chemical Vapor Deposition (PECVD) reactor is described. A method for deriving the actual minority carrier lifetime at the specific injection level of 1.1015 cm−3 is presented. This tool was used in a case study to monitor the passivation properties of aluminum oxide (AlOx) thin films upon annealing. Interesting kinetics, such as a drop of lifetime at temperatures higher than 250 °C along with a recovery of the lifetime during the cooling phase, are shown. Moreover, these in situ results combined with ex situ studies allowed us to demonstrate the formation a stable high positive fixed charge density in the AlOx layer (+1.1012 cm−2) as a consequence of the combination of annealing and light exposure.
•Description of an in situ Modulated Photo-Luminescence acquisition tool.•Method for measuring the effective lifetime at an injection level of 1.1015 cm−3.•Description of kinetics of passivation of AlOx passivated samples upon annealing.•Observation of the combined action of temperature and light exposure.•Evidencing stable, high positive fixed charges in AlOx (1.1012 cm−2). |
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ISSN: | 0927-0248 1879-3398 |
DOI: | 10.1016/j.solmat.2021.111172 |