Exchange bias in a generalized Meiklejohn–Bean approach

• Published in: Journal of magnetism and magnetic materials Vol. 234; no. 2; pp. 353 - 358
• Main Authors: Binek, Ch, Hochstrat, A., Kleemann, W.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.09.2001; Elsevier Science
• Subjects: Antiferromagnetism; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Exact sciences and technology; Exchange bias; Ferromagnetism; Interfaces; Interfacial magnetic properties (multilayers, magnetic quantum wells, superlattices, magnetic heterostructures); Magnetic properties and materials; Magnetic properties of surface, thin films and multilayers; Physics; Unidirectional anisotropy; 75.10.Hk; Interfaces; Antiferromagnetism; Unidirectional anisotropy; 75.70.Cn; Ferromagnetism; Exchange bias; Thickness; Field oriented; Magnetization; Magnetic anisotropy; Antiferromagnetic materials; Analytical method; Magnetic field effects; Theoretical study; Ferromagnetic materials; Heterostructures; Exchange interactions
• ISSN: 0304-8853
• DOI: 10.1016/S0304-8853(01)00390-0

A generalized Meiklejohn–Bean model is considered in order to derive an analytic expression for the dependence of the exchange bias field on the layer thickness involved in ferromagnetic/antiferromagnetic heterosystems, on the orientation of the applied magnetic field with respect to the magnetic easy axes and on the quenched magnetization M AF of the antiferromagnetic pinning layer. While M AF is a well-known feature of field-cooled dilute antiferromagnets, it seems to occur quite generally also in pure AF pinning substrates. The new analytic expressions are successfully compared with recent experimental results and Monte Carlo investigations.