Automatic device for testing thermal resistance with thermoelectric effect

This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor e...

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Published inJournal of physics. Conference series Vol. 1499; no. 1; pp. 12047 - 12052
Main Authors Vasiliev, I M, Soldatov, A I, Dementiev, A A, Soldatov, A A, Abouellail, A
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.03.2020
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Summary:This paper presents the results of the developed device for testing thermal resistance of thermointerface. Experiments to determine thermal resistance in different cases of thermal interface application were carried out. Dependence of thermoEMF value is obtained, which occurs between semiconductor element body and cooling system radiator at different quality of thermal interface application.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1499/1/012047