On the validity of continuous media theory for plastic materials in magnetorheological fluids under slow compression

• Published in: Rheologica acta Vol. 51; no. 7; pp. 595 - 602
• Main Authors: Ruiz-López, José Antonio, Hidalgo-Alvarez, Roque, de Vicente, Juan
• Format: Journal Article
• Language: English
• Published: Berlin/Heidelberg Springer-Verlag 01.07.2012; Springer; Springer Nature B.V
• Subjects: Characterization and Evaluation of Materials; Chemistry and Materials Science; Collapse; Complex Fluids and Microfluidics; Compressive properties; Computational fluid dynamics; Cross-disciplinary physics: materials science; rheology; Electro- and magnetorheological fluids; Exact sciences and technology; Flow theory; Fluid dynamics; Fluid flow; Food Science; Fundamental areas of phenomenology (including applications); Magnetorheological fluids; Material types; Materials Science; Mechanical Engineering; Non-newtonian fluid flows; Normalizing; Original Contribution; Physics; Polymer Sciences; Rheology; Soft and Granular Matter; Strain; Yield stress; Magnetorheology; Squeeze flow; Yielding; Magnetorheological fluids; Elongational flow; Yield stress; Viscoplastic fluid; Experimental study; Magnetorheological fluid; Squeeze film; Yield strength; Magnetic fields; Rheological properties
• ISSN: 0035-4511; 1435-1528
• DOI: 10.1007/s00397-012-0626-x

In this manuscript, we address the long-standing question of whether a single theory for model plastic fluids is suitable to deal with the unidirectional compression problem in magnetorheological (MR) fluids. We present an extensive experimental investigation of the performance of MR fluids in slow-compression, no-slip, constant-volume squeeze mode under different magnetic field strengths (0–354 kA/m), dispersing medium viscosities (20–500 mPa·s) and particle concentrations (5–30 vol%). Normal force versus compressive strain curves reasonably collapse when normalizing by the low-strain normal force. Deviations from the squeeze flow theory for field-responsive yield stress fluids are associated to microstructural rearrangements under compression in good agreement with the so-called squeeze strengthening effect. Yield compressive stresses are found to scale as H 2.0 .