A research on the reliability of light-emitting diode based on analyzing of chip image

This paper proposes a new method for studying the reliability of high-power light-emitting diode (LED) by analyzing chip images taken from a batch of LEDs which are selected to conduct the accelerated aging test lasting for 1400 hours. To exclude the disturbance of electrode in these images, an imag...

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Bibliographic Details
Published inMATEC Web of Conferences Vol. 77; p. 13002
Main Authors Ruan, Jian, Qian, Ke-Yuan
Format Journal Article Conference Proceeding
LanguageEnglish
Published Les Ulis EDP Sciences 01.01.2016
Subjects
Accelerated aging tests
Accelerated tests
Forecasting
Image processing
Light emitting diodes
Reliability analysis
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Summary:This paper proposes a new method for studying the reliability of high-power light-emitting diode (LED) by analyzing chip images taken from a batch of LEDs which are selected to conduct the accelerated aging test lasting for 1400 hours. To exclude the disturbance of electrode in these images, an image processing algorithm based on projection is used to extract the interested section. An index called “dark point” which is related to non-radiative combination to describe the reliability of LED is proposed. The method is based on analyzing the variation trends of dark points in the extracted section of these images. The results show that the proportion of the dark point increases with aging time increasing. The lifetime of LED with higher increasing rate is shorter. Based on the increasing rate of dark point, the lifetime of the chip can be predicted in an easier way.
ISSN:2261-236X
2274-7214
2261-236X
DOI:10.1051/matecconf/20167713002