Characterization of Wheat Random Amplified Polymorphic DNA Markers Associated with the H11 Hessian Fly Resistance Gene

• Published in: Journal of integrative plant biology Vol. 48; no. 8; pp. 958 - 964
• Main Authors: Bouktila, Dhia, Mezghani, Maha, Marrakchi, Mohamed, Makni, Hanem
• Format: Journal Article
• Language: English
• Published: Melbourne, Australia Blackwell Publishing Asia 01.08.2006; Laboratory of Molecular Genetics, Immunology and Biotechnology, Science Faculty of Tunis, University of Tunis El Manar,University Campus, 1068, Tunis, Tunisia
• Subjects: cultivar; Mayetiola; Mayetiola destructor; molecular markers; resistance genes; Triticum; Triticum aestivum; Triticum durum; variety; Mayetiola; resistance genes; Triticum; cultivar; variety; molecular markers
• ISSN: 1672-9072; 1744-7909
• DOI: 10.1111/j.1744-7909.2006.00254.x

In Tunisia, the Hessian fly Mayetiola destructor Say is a major pest of durum wheat (Triticum durum Desf.) and bread wheat (T. aestivum L.). Genetic resistance is the most efficient and economical method of control of this pest. To date, 31 resistance genes, designated H1–H31, have been identified in wheat. These genes condition resistance to the insect genes responsible for virulence. Using wheat cultivars differing for the presence of an individual Hessian fly resistance gene and random amplified polymorphic DNA (RAPD) analysis, we have identified a polymorphic 386‐bp DNA marker (Xgmib1‐1A.1) associated with the H11 Hessian fly resistance gene. Blast analysis showed a high identity with a short region in the wild wheat (T. monococcum) genome, adjacent to the leaf rust resistance Lr10 gene. A genetic linkage was reported between this gene (Lr10) and Hessian fly response in wheat. These data were used for screening Hessian fly resistance in Tunisian wheat germplasm. Xgmib1‐1A.1‐like fragments were detected in four Tunisian durum and bread wheat varieties. Using these varieties in Hessian fly breeding programs in Tunisia would be of benefit in reducing the damage caused by this fly. (Managing editor: Li‐Hui Zhao)