Reduced deuterium retention in simultaneously damaged and annealed tungsten

• Published in: Journal of nuclear materials Vol. 494; pp. 67 - 71
• Main Authors: Simmonds, M.J., Wang, Y.Q., Barton, J.L., Baldwin, M.J., Yu, J.H., Doerner, R.P., Tynan, G.R.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.10.2017; Elsevier BV; Elsevier
• Subjects: Annealing; Chemical elements; Concurrent ion beam damage; Copper; Damage; Data processing; Deuterium; Dynamic annealing; Energy; High temperature; MATERIALS SCIENCE; NRA; Nuclear reactors; Recovery; Retention; Spectroscopy; TDS; Temperature; Temperature effects; Thermal desorption spectroscopy; Traps; Tungsten; Deuterium; TDS; Dynamic annealing; Tungsten; Concurrent ion beam damage; Retention; NRA; Recovery
• ISSN: 0022-3115; 1873-4820
• DOI: 10.1016/j.jnucmat.2017.06.010

Deuterium (D) retention in polycrystalline tungsten (W) with copper (Cu) ion damage concurrently produced at elevated surface temperature is investigated. An in situ heated stage held W samples at a controlled temperature up to 1243 K, which were subjected to displacement damage produced by 3.4 MeV Cu ions. D retention is subsequently explored by exposure of the W samples held at 383 K to a D2 plasma ion fluence of 1024 D+/m2. Nuclear reaction analysis (NRA), utilizing the D(3He,p)4He nuclear reaction, is used to probe the D concentration in the near surface up to 6 μm. Thermal desorption spectroscopy (TDS) is used to measure outgassed HD and D2 molecules to determine the bulk D concentration. Both NRA and TDS measure a significant reduction in D retention for samples damaged at elevated temperature. TDS quantitatively shows that the lowest energy trap remains largely unaffected while higher energy traps, induced by Cu ions, are annealed and approach intrinsic concentrations as the temperature during ion damage approaches 1243 K. Analysis of TDS data yields an activation energy of (0.10 ± 0.02) eV for recovery of ion-damage induced traps at elevated temperature.