High-resolution electron microscopy image simulation on a Cray 1S/2300 computer

High-resolution electron microscopy (HREM) image simulation by the multislice method has been implemented on a Cray 1S/2300 computer, allowing accurate full nonlinear image intensity calculations with possible sampling up to 2n x 2m samples of the transmission function (n + m = 20). As examples of a...

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Bibliographic Details
Published inJournal of electron microscopy technique Vol. 10; no. 4; p. 369
Main Authors Spycher, R, Stadelmann, P, Buffat, P, Flueli, M
Format Journal Article
LanguageEnglish
Published United States 01.12.1988
Subjects
Crystallization
Gold
Image Processing, Computer-Assisted - instrumentation
Image Processing, Computer-Assisted - methods
Mathematics
Microscopy, Electron - methods
Molecular Structure
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Summary:High-resolution electron microscopy (HREM) image simulation by the multislice method has been implemented on a Cray 1S/2300 computer, allowing accurate full nonlinear image intensity calculations with possible sampling up to 2n x 2m samples of the transmission function (n + m = 20). As examples of applications, images have been obtained from an interface in PbTiO3 and of a small gold aggregate. HREM image simulation of perfect or faulted crystals can now be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells.
ISSN:0741-0581
DOI:10.1002/jemt.1060100403