Photocatalytic Activities of Amorphous TiO2-Cr Thin Films Prepared by Magnetron Sputtering
Chrome-doped titanium oxide films were prepared by reactive magnetron sputtering method. The films deposited on glass slides at room temperature were investigated by atom force microscope, X-ray diffractometer, X-ray photoelectron spectroscopy, UV-Vis spectrophotometer, the photoluminescence (PL) an...
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Published in | Journal of Wuhan University of Technology. Materials science edition Vol. 23; no. 5; pp. 610 - 616 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Heidelberg
Wuhan University of Technology
01.10.2008
Springer Nature B.V College of Materials Science and Engineering, Chongqing University, Chongqing 400045, China |
Subjects | |
Online Access | Get full text |
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Summary: | Chrome-doped titanium oxide films were prepared by reactive magnetron sputtering method. The films deposited on glass slides at room temperature were investigated by atom force microscope, X-ray diffractometer, X-ray photoelectron spectroscopy, UV-Vis spectrophotometer, the photoluminescence (PL) and ellipse polarization apparatus. The results indicate that TiO2-Cr film exists in the form of amorphous. The prepared films possess a band gap of less than 3.20 eV, and a new absorption peak. The films, irradiated for 5 h under UV light, exhibit excellent photocatalytic activities with the optimum decomposition rate at 98.5% for methylene blue. Consequently, the thickness threshold on these films is 114 nm, at which the rate of photodegradation is 95% in 5 h. When the thickness is over 114 nm, the rate of photodegradation becomes stable. This result is completely different from that of crystalloid TiO2 thin film. |
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Bibliography: | amorphous TiO2; magnetron sputtering; TiO2-Cr thin films; photocatalysis; threshold amorphous TiO2 42-1680/TB O484 magnetron sputtering threshold TiO2-Cr thin films photocatalysis ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1000-2413 1993-0437 |
DOI: | 10.1007/s11595-007-5610-1 |