On the improved phase-grating method

A new method for computing scattering amplitudes in high resolution transmission electron microscopy has been examined. The method, which is called the improved phase-grating (IPG) method, is shown to produce reasonable results only for very small specimen thicknesses and diverges for thicknesses la...

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Bibliographic Details
Published inUltramicroscopy Vol. 19; no. 1; pp. 23 - 30
Main Author Kilaas, R.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 1986
Elsevier Science
Subjects
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Other methods of structure determination
Physics
Structure of solids and liquids; crystallography
Thickness
High resolution
Transmission electron microscopy
Image theory
Scattering amplitude
Theoretical study
Calculating method
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Summary:A new method for computing scattering amplitudes in high resolution transmission electron microscopy has been examined. The method, which is called the improved phase-grating (IPG) method, is shown to produce reasonable results only for very small specimen thicknesses and diverges for thicknesses larger than 20–40 Å in copper [001] for accelerating voltages between 200 kV and 1 MV. The validity of the method is discussed and is shown to depend on electron wavelength, slice thickness, the number of reflections that are included in the calculation and the choice of specimen. It is also shown that the method does not readily allow for slice thicknesses smaller than the specimen periodicity along the incident electron beam direction.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0304-3991
1879-2723
DOI:10.1016/0304-3991(86)90004-5