Broad review of four-point probe correction factors: Enhanced analytical model using advanced numerical and experimental cross-examination

• Published in: Results in physics Vol. 48; p. 106445
• Main Authors: Chelly, Avraham, Glass, Simcha, Belhassen, Jeremy, Karsenty, Avi
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.05.2023; Elsevier
• Subjects: Conductivity; Four-point probe method; Numerical and Analytical analysis; Resistivity; Conductivity; Four-point probe method; Resistivity; Numerical and Analytical analysis
• ISSN: 2211-3797; 2211-3797
• DOI: 10.1016/j.rinp.2023.106445

[Display omitted] •Extensive review of the four-point probe correction factors.•Improved analytical model based on numerical and experimental cross-examination.•Classic expressions modification for geometrical factors in light of simulations.•Simulated results accuracy is significantly increased by modified expressions.•Case-study reference method for additional experiments like resistivity checks. Following a comprehensive top-to-bottom review of the four-point probe’s (4PP) system configurations and usages, an original, cross-checking approach of combining analytical, experimental and numerical methods is presented to serve as a simple unified package for determining electrical resistivity. After a successful comparison based on error analysis between the different results, a robust correction of the analytical model is presented to extract the electrical resistivity from simulations results. Moreover, we present original results from a selection of models and measurements of resistivity applied to germanium samples sharing non-ideal geometries.