A solution to the charging problems in capacitive micromachined ultrasonic transducers

We report on a capacitive micromachined ultrasonic transducer (CMUT) featuring isolation posts (PostCMUT) as a solution to the charging problems caused by device fabrication and operation. This design improves the device reliability. The PostCMUTs were fabricated using a newly developed process base...

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Bibliographic Details
Published inIEEE transactions on ultrasonics, ferroelectrics, and frequency control Vol. 52; no. 4; pp. 578 - 580
Main Authors Yongli Huang, Haeggstrom, E.O., Xuefeng Zhuang, Ergun, A.S., Khuri-Yakub, B.T.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.04.2005
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:We report on a capacitive micromachined ultrasonic transducer (CMUT) featuring isolation posts (PostCMUT) as a solution to the charging problems caused by device fabrication and operation. This design improves the device reliability. The PostCMUTs were fabricated using a newly developed process based on the wafer-bonding technique. Paired tests showed the superior reliability characteristics of the PostCMUT design compared to those of conventional CMUT designs. No deleterious effect of the new design was seen in preliminary ultrasonic tests or in process yield. PostCMUTs, a design that serves as a solution to the aforementioned reliability problem, constitutes a major contribution to CMUT commercialization.
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ISSN:0885-3010
1525-8955
DOI:10.1109/TUFFC.2005.1428039