A new method to analyze density fluctuation by microwave reflectometry

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 36; no. 12A; pp. 7367 - 7374
Main Authors SHINOHARA, K, SHIRAIWA, S, HOSHINO, K, MIURA, Y, HANADA, K, TOYAMA, H
Format Journal Article
LanguageEnglish
Published Tokyo Japanese journal of applied physics 01.12.1997
Subjects
Exact sciences and technology
Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Physics of gases, plasmas and electric discharges
Physics of plasmas and electric discharges
Plasma diagnostic techniques and instrumentation
Radio-frequency and microwave measurements
Electromagnetic wave scattering
JFT-2M tokamak
Plasma diagnostics
Experimental study
Microwave reflectometry
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ISSN:0021-4922
1347-4065
DOI:10.1143/jjap.36.7367