SNaP: A novel hybrid method for circuit reliability assessment under multiple faults

• Published in: Microelectronics and reliability Vol. 53; no. 9-11; pp. 1230 - 1234
• Main Authors: Pagliarini, S.N., Ben Dhia, A., Naviner, L.A. de B., Naviner, J.-F.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Kidlington Elsevier Ltd 01.09.2013; Elsevier
• Subjects: Applied sciences; Assessments; Circuit reliability; Circuits; Design. Technologies. Operation analysis. Testing; Electronics; Engineering Sciences; Exact sciences and technology; Faults; Gates (circuits); Integrated circuits; Mathematical analysis; Micro and nanotechnologies; Microelectronics; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices; Simulation; SNAP; Masking; Hybrid integrated circuit; Reliability; Analytical solution; Hybrid circuit; Analytical method
• ISSN: 0026-2714; 1872-941X
• DOI: 10.1016/j.microrel.2013.07.027

•Hybrid reliability assessment method.•Supports multiple faults.•Benefits from emulation. This paper proposes a novel method for the assessment of circuit reliability, termed SNaP. Since it combines the properties of both simulation-based and analytical solutions, the proposed method is considered hybrid. Furthermore, it has the ability to deal with the occurrence of multiple faults while taking logic masking into account. As opposed to other reliability methods found in the literature, the proposed method has a linear complexity with the number of gates, which allows for the evaluation of complex circuits. The results presented are in good agreement with other methods in the literature.