Reliable Operation of GaInAsP/InP Distributed Feedback Laser with Wirelike Active Regions

A continuous-wave life test of 1550 nm wavelength buried-heterostructure distributed feedback lasers with wirelike active regions, fabricated by CH4/H2 reactive-ion-etching and OMVPE, was performed at RT. No degradations in lasing characteristics were observed after an aging time of 8200 h at a bias...

Full description

Saved in:
Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 42; no. Part 1, No. 2A; pp. 475 - 476
Main Authors Ohira, Kazuya, Nunoya, Nobuhiro, Yagi, Hideki, Muranushi, Kengo, Onomura, Akihiro, Tamura, Shigeo, Arai, Shigehisa
Format Journal Article
LanguageEnglish
Published 2003
Online AccessGet full text

Cover

More Information
Summary:A continuous-wave life test of 1550 nm wavelength buried-heterostructure distributed feedback lasers with wirelike active regions, fabricated by CH4/H2 reactive-ion-etching and OMVPE, was performed at RT. No degradations in lasing characteristics were observed after an aging time of 8200 h at a bias current of around 10 times the threshold value. 6 refs.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.42.475