Angle-resolved photoelectron spectroscopy in a low-energy electron microscope

• Published in: Structural dynamics (Melville, N.Y.) Vol. 10; no. 6; p. 064304
• Main Authors: Neuhaus, Alexander, Dreher, Pascal, Schütz, Florian, Marchetto, Helder, Franz, Torsten, Meyer zu Heringdorf, Frank
• Format: Journal Article
• Language: English
• Published: United States American Institute of Physics, Inc 01.11.2023; AIP Publishing LLC and ACA
• Subjects: Aperture; Data acquisition; Electron microscopes; Electron optics; Electronic structure; Electrons; Energy; Laser applications; Lasers; Microscopy; Momentum; Phase transitions; Photoelectric emission; Photoelectrons; Photogrammetry; Sensors; Spectroscopy; Spectrum analysis
• ISSN: 2329-7778; 2329-7778
• DOI: 10.1063/4.0000216

Spectroscopic photoemission microscopy is a well-established method to investigate the electronic structure of surfaces. In modern photoemission microscopes, the electron optics allow imaging of the image plane, momentum plane, or dispersive plane, depending on the lens setting. Furthermore, apertures allow filtering of energy-, real-, and momentum space. Here, we describe how a standard spectroscopic and low-energy electron microscope can be equipped with an additional slit at the entrance of the already present hemispherical analyzer to enable an angle- and energy-resolved photoemission mode with micrometer spatial selectivity. We apply a photogrammetric calibration to correct for image distortions of the projective system behind the analyzer and present spectra recorded on Au(111) as a benchmark. Our approach makes data acquisition in energy–momentum space more efficient, which is a necessity for laser-based pump–probe photoemission microscopy with femtosecond time resolution.