Reliability Analysis for Electronic Devices Using Generalized Exponential Distribution

• Published in: IEEE access Vol. 8; pp. 108629 - 108644
• Main Authors: Ali, Sajid, Ali, Shafaqat, Shah, Ismail, Siddiqui, Ghazanfar Farooq, Saba, Tanzila, Rehman, Amjad
• Format: Journal Article
• Language: English
• Published: Piscataway IEEE 2020; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Bayesian analysis; beta generalized exponential distribution; Electronic devices; Failure analysis; generalized exponential distribution; inverse power law; Parameter estimation; Parameter modification; Probability distribution functions; Reliability analysis; reliability data analysis; sensitivity analysis; Statistical inference; voltage
• ISSN: 2169-3536; 2169-3536
• DOI: 10.1109/ACCESS.2020.3000951

Electronic devices are integral part of our life and modeling their lifetime is the most challenging and interesting field in reliability analysis. To investigate the failure behavior of electronic devices reliability analysis is commonly used. In the literature, however, it is reported that one in five electronic device failure is a result of corrosion and to save electricity and predict future failures, it is important to summarize the data by some flexible probability models. This will not only help the electronic companies, but also the users by providing them information about the maximum voltage level that a particular device can bear. This article deals with the reliability analysis of electronic devices under different voltages assuming modified generalized exponential distribution and beta generalized exponential distribution using the inverse power law rule. The parameters of the modified distribution are estimated assuming Bayesian inference to include prior information. Sensitivity of hyperparameters and selection of an appropriate probability model is also a part of this study.