Observation of intrinsic Josephson junction properties on (Bi,Pb)SrCaCuO thin films

• Published in: Japanese Journal of Applied Physics Vol. 36; no. 1AB; pp. L21 - L23
• Main Authors: ODAGAWA, A, SAKAI, M, ADACHI, H, SETSUNE, K, HIRAO, T, YOSHIDA, K
• Format: Journal Article
• Language: English
• Published: Tokyo Japanese journal of applied physics 01.01.1997
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Exact sciences and technology; Multilayers, superlattices , heterostructures; Physics; Proximity effects, weak links, tunneling phenomena, and Josephson effects; Proximity effects, weak links, tunneling phenomena, and josephson effects, adreev effect, sn and sns junctions; Superconducting films and low-dimensional structures; Superconductivity; Inorganic compounds; Transition element compounds; Bismuth oxides; Lead oxides; Order parameters; Heat treatments; Thin films; Calcium oxides; Strontium oxides; Multi-element compounds; Superconducting junctions; Preparation; High-Tc superconductors; Josephson junctions; IV characteristic; Copper oxides; Radiofrequency sputtering
• ISSN: 0021-4922; 1347-4065
• DOI: 10.1143/jjap.36.l21

We have fabricated intrinsic Josephson junctions for (Bi,Pb) 2 Sr 2 Ca 2 Cu 3 O x thin films and investigated their electronic characteristics. Mesa structures with the junctions are fabricated on the surface of high-quality films prepared by rf-sputtering and subsequent heat treatment. The junctions show distinct hysteresis and a multiple branching structure with a periodic voltage jump at a current-voltage response. These results demonstrate that the fabricated mesas consist of stacked series SIS junctions. From this periodic structure, a voltage jump of 26–28 mV is obtained for the 2223 phase at 4.2 K.