Surface secondary electron and secondary ion emission induced by large molecular ion impacts

This paper presents results on secondary ion and secondary electron yields under impact of large ions at 18 keV and with 100 < m/z < 70 000 on a CsI-coated surface. Ratios of secondary electron emission to secondary ion emission have been measured and it is shown that the negative secondary io...

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Bibliographic Details
Published inInternational journal of mass spectrometry and ion processes Vol. 126; pp. 65 - 73
Main Authors Brunelle, A., Chaurand, P., Della-Negra, S., Le Beyec, Y., Baptista, G.B.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 29.07.1993
Elsevier
Subjects
Nuclear Experiment
Physics
Plasma desorption mass spectrometry
Secondary electron emission
Secondary ion emission
Plasma desorption mass spectrometry
Secondary ion emission
Secondary electron emission
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Summary:This paper presents results on secondary ion and secondary electron yields under impact of large ions at 18 keV and with 100 < m/z < 70 000 on a CsI-coated surface. Ratios of secondary electron emission to secondary ion emission have been measured and it is shown that the negative secondary ion yield is much larger than the electron yield. Electrons are still emitted below an energy of impact per mass unit of 1 eV Da −1 (10 6 cm s −1). Effects of grids in the acceleration of secondary ions and secondary electrons are important.
ISSN:0168-1176
1873-2801
DOI:10.1016/0168-1176(93)80071-L