Effects of multi-defects at metal/semiconductor interfaces on electrical properties and their influence on stability and lifetime of thin film solar cells

This communication analyses some of the results observed for metal/n-CdTe interfaces in the mid-1980s, which could not be interpreted at that time. These observations are analysed on the basis of new understanding using a new model proposed for CdS/CdTe thin film solar cells. The observed behaviour...

Full description

Saved in:
Bibliographic Details
Published inSolar energy materials and solar cells Vol. 86; no. 3; pp. 373 - 384
Main Authors Dharmadasa, I.M., Bunning, J.D., Samantilleke, A.P., Shen, T.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 31.03.2005
Elsevier
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:This communication analyses some of the results observed for metal/n-CdTe interfaces in the mid-1980s, which could not be interpreted at that time. These observations are analysed on the basis of new understanding using a new model proposed for CdS/CdTe thin film solar cells. The observed behaviour of current–voltage characteristics of electrical contacts to n-CdTe under electrical and illumination stresses are explained and the effects of these changes on CdS/CdTe solar cells are discussed. Future research directions for the development of CdS/CdTe solar cells are proposed and the way forward for improvement of stability and lifetime of solar cells is suggested. A summary of recent electrical contact work on metal/Cu(InGa)(SSe) 2 interfaces is also presented and similar behaviour is reported.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0927-0248
1879-3398
DOI:10.1016/j.solmat.2004.08.009