Bayesian Point Cloud Reconstruction
In this paper, we propose a novel surface reconstruction technique based on Bayesian statistics: The measurement process as well as prior assumptions on the measured objects are modeled as probability distributions and Bayes’ rule is used to infer a reconstruction of maximum probability. The key ide...
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Published in | Computer graphics forum Vol. 25; no. 3; pp. 379 - 388 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Oxford, UK and Boston, USA
Blackwell Publishing, Inc
01.09.2006
Blackwell Publishing Ltd |
Subjects | |
Online Access | Get full text |
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Summary: | In this paper, we propose a novel surface reconstruction technique based on Bayesian statistics: The measurement process as well as prior assumptions on the measured objects are modeled as probability distributions and Bayes’ rule is used to infer a reconstruction of maximum probability. The key idea of this paper is to define both measurements and reconstructions as point clouds and describe all statistical assumptions in terms of this finite dimensional representation. This yields a discretization of the problem that can be solved using numerical optimization techniques. The resulting algorithm reconstructs both topology and geometry in form of a well‐sampled point cloud with noise removed. In a final step, this representation is then converted into a triangle mesh. The proposed approach is conceptually simple and easy to extend. We apply the approach to reconstruct piecewise‐smooth surfaces with sharp features and examine the performance of the algorithm on different synthetic and real‐world data sets.
Categories and Subject Descriptors (according to ACM CCS): I.5.1 [Models]: Statistical; I.3.5 [Computer Graphics]: Curve, surface, solid and object representations |
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Bibliography: | ArticleID:CGF957 istex:D4A77122004783E2569BA6CAFE4C89966A773FCE ark:/67375/WNG-WGFCDTR0-T ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0167-7055 1467-8659 |
DOI: | 10.1111/j.1467-8659.2006.00957.x |