Normalized analysis for the sensitivity optimization of integrated optical evanescent-wave sensors

• Published in: Journal of lightwave technology Vol. 16; no. 4; pp. 573 - 582
• Main Authors: Parriaux, O., Veldhuis, G.J.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.04.1998; Institute of Electrical and Electronics Engineers
• Subjects: Applied sciences; Biosensors; Circuit properties; Electric, optical and optoelectronic circuits; Electronics; Exact sciences and technology; General equipment and techniques; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Integrated optics; Integrated optics. Optical fibers and wave guides; Magnetic field measurement; Magnetic sensors; Optical and optoelectronic circuits; Optical films; Optical refraction; Optical sensors; Optical surface waves; Optical waveguides; Physics; Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing; Surface waves; Waveguides, couplers, and arrays; Integrated optics; Chemical sensors; Sensitivity analysis; Analytical method; Theoretical study; Biosensors; Optical sensors; Evanescent wave; Optical waveguides
• ISSN: 0733-8724; 1558-2213
• DOI: 10.1109/50.664066

Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface.