Observation of He bubbles in ion irradiated fusion materials by conductive atomic force microscopy
Using a non-destructive conductive atomic force microscope combined with the Ar+ etching technique, we demonstrate that nanoscale and conductive He bubbles are formed in the implanted layer of single-crystalline 6H-SiC irradiated with 100keV He+. We find that the surface swelling of irradiated SiC s...
Saved in:
Published in | Journal of nuclear materials Vol. 441; no. 1-3; pp. 54 - 58 |
---|---|
Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.10.2013
Elsevier |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Using a non-destructive conductive atomic force microscope combined with the Ar+ etching technique, we demonstrate that nanoscale and conductive He bubbles are formed in the implanted layer of single-crystalline 6H-SiC irradiated with 100keV He+. We find that the surface swelling of irradiated SiC samples is well correlated with the growth of elliptic He bubbles in the implanted layer. First-principle calculations are performed to estimate the internal pressure of the He bubble in the void of SiC. Analysis indicates that nanoscale He bubbles acting as a captor capture the He atoms diffusing along the implanted layer at an evaluated temperature and result in the surface swelling of irradiated SiC materials. |
---|---|
Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0022-3115 1873-4820 |
DOI: | 10.1016/j.jnucmat.2013.05.034 |