Observation of He bubbles in ion irradiated fusion materials by conductive atomic force microscopy

Using a non-destructive conductive atomic force microscope combined with the Ar+ etching technique, we demonstrate that nanoscale and conductive He bubbles are formed in the implanted layer of single-crystalline 6H-SiC irradiated with 100keV He+. We find that the surface swelling of irradiated SiC s...

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Published inJournal of nuclear materials Vol. 441; no. 1-3; pp. 54 - 58
Main Authors Fan, Hongyu, Li, Ruihuan, Yang, Deming, Wu, Yunfeng, Niu, Jinhai, Yang, Qi, Zhao, Jijun, Liu, Dongping
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.10.2013
Elsevier
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Summary:Using a non-destructive conductive atomic force microscope combined with the Ar+ etching technique, we demonstrate that nanoscale and conductive He bubbles are formed in the implanted layer of single-crystalline 6H-SiC irradiated with 100keV He+. We find that the surface swelling of irradiated SiC samples is well correlated with the growth of elliptic He bubbles in the implanted layer. First-principle calculations are performed to estimate the internal pressure of the He bubble in the void of SiC. Analysis indicates that nanoscale He bubbles acting as a captor capture the He atoms diffusing along the implanted layer at an evaluated temperature and result in the surface swelling of irradiated SiC materials.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0022-3115
1873-4820
DOI:10.1016/j.jnucmat.2013.05.034