Characterization of surface plasmon resonance wavelength by changes of protein concentration on protein chips

We have characterized surface plasmon resonance (SPR) wavelength as a function of protein concentration on protein array by a new ex situ SPR sensor based on wavelength interrogation. The spectral range of the spectrometer was from 500 to 700 nm and the surface structure of protein array is consiste...

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Published inSensors and actuators. B, Chemical Vol. 94; no. 2; pp. 161 - 164
Main Authors Yuk, Jong Seol, Yi, Sun-Ju, Lee, Hyeon Gon, Lee, Hyun Jung, Kim, Young-Myeong, Ha, Kwon-Soo
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.09.2003
Subjects
Biosensors
Ex situ SPR sensor
Protein array
Proteins
Q1
Refractive index
Spectroscopy
SPR
tTGase
Protein array
SPR
Refractive index
Ex situ SPR sensor
tTGase
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Summary:We have characterized surface plasmon resonance (SPR) wavelength as a function of protein concentration on protein array by a new ex situ SPR sensor based on wavelength interrogation. The spectral range of the spectrometer was from 500 to 700 nm and the surface structure of protein array is consisted of glass/Ti/Au/tTGase/air (ex situ). The ex situ SPR sensor was self-constructed and its detection limit of minimal refractive index variation was calculated to be 7.6×10 −5. The experimental result showed that the SPR wavelength was linearly shifted with respect to the increment of tissue transglutaminase concentration from 20 to 120 μg/ml. These results suggest that the ex situ wavelength interrogation-based SPR sensor can be used as a good tool for the analysis of protein array.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0925-4005
1873-3077
DOI:10.1016/S0925-4005(03)00345-9