Structural properties of transparent Ti-V oxide semiconductor thin films
Transparent oxide semiconducting thin films based on mixed Ti-V oxides were prepared using a modified reactive magnetron sputtering method. Based on structural investigations performed with the help of x-ray diffraction and transmission electron microscopy analysis, two distinct regions in the prepa...
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Published in | Central European journal of physics Vol. 11; no. 2; pp. 251 - 257 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Heidelberg
SP Versita
01.02.2013
Versita De Gruyter |
Subjects | |
Online Access | Get full text |
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