A New Nanospectroscopy Tool with Synchrotron Radiation: NanoESCA@Elettra

We describe first experiences with a novel spectromicroscopy set-up — NanoESCA@Elettra — which has been installed at the nanospectroscopy soft x-ray beamline at Elettra (Trieste). The system features an energy-filtered photoemission microscope with a 30 kV immersion lens system and a double-hemisphe...

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Bibliographic Details
Published inE-journal of surface science and nanotechnology Vol. 9; pp. 395 - 399
Main Authors Wiemann, Carsten, Patt, Marten, Krug, Ingo P., Weber, Nils B., Escher, Matthias, Merkel, Michael, Schneider, Claus M.
Format Journal Article
LanguageEnglish
Published The Japan Society of Vacuum and Surface Science 01.01.2011
Subjects
Photoemission Electron Microscopy (PEEM)
Spectromicroscopy
Synchrotron radiation photoelectron spectroscopy
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Summary:We describe first experiences with a novel spectromicroscopy set-up — NanoESCA@Elettra — which has been installed at the nanospectroscopy soft x-ray beamline at Elettra (Trieste). The system features an energy-filtered photoemission microscope with a 30 kV immersion lens system and a double-hemispherical energy analyzer. The instrument provides both real space and k-space mapping modes. Experiments on nanostructured samples with laboratory gas discharge sources show a lateral resolution of less than 50 nm and an energy resolution of better than 200 meV. We have also performed first tests of the instrument with synchrotron radiation. [DOI: 10.1380/ejssnt.2011.395]
ISSN:1348-0391
1348-0391
DOI:10.1380/ejssnt.2011.395