System for in situ observation of three-dimensional structural changes in polymer films during uniaxial deformation
A simple three‐dimensional structural evaluation system for a film during uniaxial deformation has been developed. The system is realized with an automatic film stretching machine, which allows the horizontally symmetric stretching of a film, and a synchrotron radiation X‐ray scattering apparatus. U...
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Published in | Journal of applied crystallography Vol. 48; no. 4; pp. 1016 - 1022 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
5 Abbey Square, Chester, Cheshire CH1 2HU, England
International Union of Crystallography
01.08.2015
Blackwell Publishing Ltd |
Subjects | |
Online Access | Get full text |
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Summary: | A simple three‐dimensional structural evaluation system for a film during uniaxial deformation has been developed. The system is realized with an automatic film stretching machine, which allows the horizontally symmetric stretching of a film, and a synchrotron radiation X‐ray scattering apparatus. Using this system, two‐dimensional patterns of small‐angle X‐ray scattering and wide‐angle X‐ray diffraction can be obtained simultaneously during film stretching in the so‐called edge and end views, together with stress–strain data. As cylindrical symmetry of the structure can be expected for a uniaxially stretched film, the two‐dimensional patterns in the through view are identical to those in the edge view, indicating that three‐dimensional structural characterization can be performed with a combination of edge and end views during film stretching. For amorphous poly(ethylene terephthalate) and crystalline poly(vinyl alcohol) films, the preliminary results of three‐dimensional structural characterization during film stretching are shown. |
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Bibliography: | ark:/67375/WNG-X6L7DBL7-X istex:2ABD2309E44E163AF2B0321ACE1BDFC0895A35EF ArticleID:JCR2FS5102 |
ISSN: | 1600-5767 0021-8898 1600-5767 |
DOI: | 10.1107/S1600576715008031 |