Si diffusion behavior during laser welding-brazing of Al alloy and Ti alloy with Al-12Si filler wire

• Published in: Transactions of Nonferrous Metals Society of China Vol. 20; no. 1; pp. 64 - 70
• Main Author: 陈树海 李俐群 陈彦宾 刘德健
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 2010; State Key Laboratory of Advanced Welding Production Technology,Harbin Institute of Technology, Harbin 150001, China
• Subjects: Aluminum base alloys; Chemical potential; Diffusion; diffusion behavior; interfacial reaction; Laser beam welding; laser welding-brazing; Mathematical models; Silicon; Titanium; Titanium base alloys; 扩散行为; 激光焊接; 硅元素; 金属界面; 金属间化合物; 钛铝合金; 预测模型; diffusion behavior; laser welding-brazing; interfacial reaction; chemical potential
• ISSN: 1003-6326
• DOI: 10.1016/S1003-6326(09)60098-4

In laser welding-brazing of Al alloy （5A06） and Ti alloy （Ti-6Al-4V） with rectangular CO2 laser spot and with Al-12Si filler wire, element Si enriches at the interface between Ti substrate and the filler metal. It is found that the Si diffusion behavior has a significant effect on the formation of interfacial intermetallic compounds. To analyze the Si diffusion behavior, a model for the prediction of the chemical potential for ternary alloy was established. According to the calculated results of the influence of the element content and temperature in Ti-Al-Si system on Si chemical potential, the diffusion behavior of Si element was analyzed for Ti dissolution and melting mode, which presents a good agreement with the experimental data. Further, formation mechanism of the interracial inter~netllic compound was clarified.