Nanostructural depth profile of vanadium/cerium oxide film as a host for lithium ions

• Published in: Solar energy materials and solar cells Vol. 91; no. 7; pp. 616 - 620
• Main Authors: Lučić Lavčević, M., Dubček, P., Turković, A., Crnjak-Orel, Z., Bernstorff, S.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 16.04.2007; Elsevier
• Subjects: Applied sciences; Energy; Exact sciences and technology; Lithium intercalation; Mixed-oxide electrode; Nanostructure; Natural energy; Photovoltaic conversion; Small-angle X-ray scattering; Solar energy; Mixed-oxide electrode; Nanostructure; Lithium intercalation; Small-angle X-ray scattering; Particle size; Grazing incidence; Electrochemical cell; Cerium oxide; Small angle X ray scattering; Sol gel process; Depth profile; Vanadium oxide; Smooth surface; Lithium ion; Incidence ray
• ISSN: 0927-0248; 1879-3398
• DOI: 10.1016/j.solmat.2006.11.013

Nanostructural characteristics of vanadium/cerium mixed-oxide film, prepared by sol–gel process at 55 atom% of V and intercalated by lithium ions, were studied by grazing incidence small-angle X-ray scattering (GISAXS). Particle size distributions were estimated probing different film regions, from its surface to the substrate. The intercalation of lithium affects the particle size distribution in film: the average particle size is reduced, while the size distribution width is increased. The surface is smoothed after intercalation, and its contribution to the scattering becomes dominating. The average particle size is the greatest at the surface, decreasing with the depth, and this is not essentially influenced by intercalation.