Relations Between Basic Nuclear Data and Single-Event Upsets Phenomena

• Published in: MRS bulletin Vol. 28; no. 2; pp. 121 - 125
• Main Authors: Blomgren, Jan, Granbom, Bo, Granlund, Thomas, Olsson, Nils
• Format: Journal Article
• Language: English
• Published: New York, USA Cambridge University Press 01.02.2003; Springer Nature B.V
• Subjects: microelectronics; Neutron beams; Nuclear cross sections; nuclear data; Nuclear physics; Single event upsets; Spallation; Technical Feature; single-event upsets; nuclear data; microelectronics
• ISSN: 0883-7694; 1938-1425
• DOI: 10.1557/mrs2003.39

This article approaches single-event upset (SEU) problems from the standpoint of experimental nuclear physics, with a focus on certain neutron experiments and neutron data essential for SEU studies. A review is given of some research programs, both basic and applied, that are strongly motivated by SEU applications. Some specific examples are presented from the The (short for Theodor) Svedberg Laboratory (TSL) in Uppsala, Sweden: First, using the quasi-monoenergetic neutron beam, SEU cross sections (of chips) are measured over the neutron energy range of 20–150 MeV. Data from the same technology generation, in general, can be fitted into a simple curve. Second, the particle origins of SEUs are discussed from the framework of neutron–nucleus spallation reactions.