Analysis of Charge Deposition and Collection Caused by Low Energy Neutrons in a 25-nm Bulk CMOS Technology
Neutron-induced single event upsets (SEUs) in a 25-nm NMOSFET are analyzed using PHYSERD simulation. We confirm that the secondary H and He ions dominate SEUs above the threshold energies of (n,p) and ( n, α) reactions although the production cross sections for H and He ions are smaller than the ela...
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Published in | IEEE transactions on nuclear science Vol. 61; no. 6; pp. 3519 - 3526 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.12.2014
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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Abstract | Neutron-induced single event upsets (SEUs) in a 25-nm NMOSFET are analyzed using PHYSERD simulation. We confirm that the secondary H and He ions dominate SEUs above the threshold energies of (n,p) and ( n, α) reactions although the production cross sections for H and He ions are smaller than the elastic scattering cross sections below 20 MeV. The SEUs induced by secondary H and He ions are influenced strongly by the size of the interaction volume considered in the simulation because the ranges of H and He ions are much longer than those of elastic recoils. |
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AbstractList | Neutron-induced single event upsets (SEUs) in a 25-nm NMOSFET are analyzed using PHYSERD simulation. We confirm that the secondary H and He ions dominate SEUs above the threshold energies of (n,p) and ([Formula Omitted]) reactions although the production cross sections for H and He ions are smaller than the elastic scattering cross sections below 20 MeV. The SEUs induced by secondary H and He ions are influenced strongly by the size of the interaction volume considered in the simulation because the ranges of H and He ions are much longer than those of elastic recoils. Neutron-induced single event upsets (SEUs) in a 25-nm NMOSFET are analyzed using PHYSERD simulation. We confirm that the secondary H and He ions dominate SEUs above the threshold energies of (n,p) and ( n, α) reactions although the production cross sections for H and He ions are smaller than the elastic scattering cross sections below 20 MeV. The SEUs induced by secondary H and He ions are influenced strongly by the size of the interaction volume considered in the simulation because the ranges of H and He ions are much longer than those of elastic recoils. |
Author | Watanabe, Yukinobu Abe, Shin-ichiro |
Author_xml | – sequence: 1 givenname: Shin-ichiro surname: Abe fullname: Abe, Shin-ichiro organization: Dept. of Adv. Energy Eng., Kyushu Univ., Fukuoka, Japan – sequence: 2 givenname: Yukinobu surname: Watanabe fullname: Watanabe, Yukinobu email: watanabe@aees.kyushu-u.ac.jp organization: Dept. of Adv. Energy Eng., Kyushu Univ., Fukuoka, Japan |
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Snippet | Neutron-induced single event upsets (SEUs) in a 25-nm NMOSFET are analyzed using PHYSERD simulation. We confirm that the secondary H and He ions dominate SEUs... |
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SubjectTerms | CMOS technology Monte Carlo methods Monte Carlo simulation MOSFET circuits Neutrons PHYSERD Radiation effects single event upset (SEU) Single event upsets terrestrial radiation effects |
Title | Analysis of Charge Deposition and Collection Caused by Low Energy Neutrons in a 25-nm Bulk CMOS Technology |
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