X-ray detection with multi-anode sawtooth silicon drift detectors
We present results of room temperature and low-temperature X-ray measurements with 500 /spl mu/m anode pitch Multi-anode Linear and Sawtooth Silicon Drift Detectors. An analysis of the influence of split events due to the lateral spread of the drifting electron cloud, electronic noise and the genera...
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| Published in | IEEE transactions on nuclear science Vol. 47; no. 3; pp. 750 - 755 |
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| Main Authors | , , , , |
| Format | Journal Article |
| Language | English |
| Published |
New York
IEEE
01.06.2000
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subjects | |
| Online Access | Get full text |
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| Abstract | We present results of room temperature and low-temperature X-ray measurements with 500 /spl mu/m anode pitch Multi-anode Linear and Sawtooth Silicon Drift Detectors. An analysis of the influence of split events due to the lateral spread of the drifting electron cloud, electronic noise and the general spectroscopic performance of the detectors is given. An energy resolution of 450 eV FWHM was determined for the 5.89 keV line of /sup 55/Fe at 233 K. Split events are completely eliminated. |
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| AbstractList | We present results of room temperature and low-temperature X-ray measurements with 500 /spl mu/m anode pitch Multi-anode Linear and Sawtooth Silicon Drift Detectors. An analysis of the influence of split events due to the lateral spread of the drifting electron cloud, electronic noise and the general spectroscopic performance of the detectors is given. An energy resolution of 450 eV FWHM was determined for the 5.89 keV line of /sup 55/Fe at 233 K. Split events are completely eliminated. We present results of room-temperature and low-temperature X-ray measurements with 500-micron anode pitch multi-anode linear and sawtooth silicon drift detectors. An analysis of the influence of split events due to the lateral spread of the drifting electron cloud, electronic noise, and the general spectroscopic performance of the detectors is given. An energy resolution of 450-eV FWHM was determined for the 5.89-keV line of Fe-55 at 233 K. Split events are completely eliminated. (Author) We present results of room temperature and low-temperature X-ray measurements with 500 mum anode pitch Multi-anode Linear and Sawtooth Silicon Drift Detectors. An analysis of the influence of split events due to the lateral spread of the drifting electron cloud, electronic noise and the general spectroscopic performance of the detectors is given. An energy resolution of 450 eV FWHM was determined for the 5.89 keV line of (55)Fe at 233 K. Split events are completely eliminated We present results of room temperature and low-temperature X-ray measurements with 500 mu m anode pitch Multi-anode Linear and Sawtooth Silicon Drift Detectors. An analysis of the influence of split events due to the lateral spread of the drifting electron cloud, electronic noise and the general spectroscopic performance of the detectors is given. An energy resolution of 450 eV FWHM was determined for the 5.89 keV line of super(55)Fe at 233 K. Split events are completely eliminated |
| Author | Hollander, R.W. Huizenga, J. Sonsky, J. van Eijk, C.W.E. Sarro, P.M. |
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| Snippet | We present results of room temperature and low-temperature X-ray measurements with 500 /spl mu/m anode pitch Multi-anode Linear and Sawtooth Silicon Drift... We present results of room temperature and low-temperature X-ray measurements with 500 mu m anode pitch Multi-anode Linear and Sawtooth Silicon Drift... We present results of room-temperature and low-temperature X-ray measurements with 500-micron anode pitch multi-anode linear and sawtooth silicon drift... We present results of room temperature and low-temperature X-ray measurements with 500 mum anode pitch Multi-anode Linear and Sawtooth Silicon Drift Detectors.... |
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| SubjectTerms | Anodes Clouds Detectors Drift Electronics Electrons Event detection Noise Performance analysis Silicon Spectroscopy Spreads Temperature X-ray detection X-ray detectors X-rays |
| Title | X-ray detection with multi-anode sawtooth silicon drift detectors |
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