X-ray detection with multi-anode sawtooth silicon drift detectors

We present results of room temperature and low-temperature X-ray measurements with 500 /spl mu/m anode pitch Multi-anode Linear and Sawtooth Silicon Drift Detectors. An analysis of the influence of split events due to the lateral spread of the drifting electron cloud, electronic noise and the genera...

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Bibliographic Details
Published inIEEE transactions on nuclear science Vol. 47; no. 3; pp. 750 - 755
Main Authors Sonsky, J., Huizenga, J., Hollander, R.W., van Eijk, C.W.E., Sarro, P.M.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.06.2000
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Anodes
Clouds
Detectors
Drift
Electronics
Electrons
Event detection
Noise
Performance analysis
Silicon
Spectroscopy
Spreads
Temperature
X-ray detection
X-ray detectors
X-rays
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Summary:We present results of room temperature and low-temperature X-ray measurements with 500 /spl mu/m anode pitch Multi-anode Linear and Sawtooth Silicon Drift Detectors. An analysis of the influence of split events due to the lateral spread of the drifting electron cloud, electronic noise and the general spectroscopic performance of the detectors is given. An energy resolution of 450 eV FWHM was determined for the 5.89 keV line of /sup 55/Fe at 233 K. Split events are completely eliminated.
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ISSN:0018-9499
1558-1578
DOI:10.1109/23.856509