A tower model for lightning overvoltage studies based on the result of an FDTD simulation
This paper describes a method for deriving a transmission tower model for EMTP lightning overvoltage studies from a numerical electromagnetic field simulation result obtained by the FDTD (Finite Difference Time Domain) method. The FDTD simulations carried out in this paper take into account the foll...
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Published in | Electrical engineering in Japan Vol. 164; no. 1; pp. 8 - 20 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
Hoboken
Wiley Subscription Services, Inc., A Wiley Company
15.07.2008
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Subjects | |
Online Access | Get full text |
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Summary: | This paper describes a method for deriving a transmission tower model for EMTP lightning overvoltage studies from a numerical electromagnetic field simulation result obtained by the FDTD (Finite Difference Time Domain) method. The FDTD simulations carried out in this paper take into account the following items which have been ignored or oversimplified in previously presented simulations: (i) resistivity of the ground soil; (ii) arms, major slant elements, and foundations of the tower; (iii) development speed of the lightning return stroke. For validation purpose a pulse test of a 500‐kV transmission tower is simulated, and a comparison with the measured result shows that the present FDTD simulation gives a sufficiently accurate result. Using this validated FDTD‐based simulation method the insulator‐string voltages of a tower for lightning strokes are calculated, and based on the simulation result the parameter values of the proposed tower model for EMTP studies are determined in a systematic way. Since previously presented models include trial‐and‐error process in the parameter determination, it can be said that the proposed model is more general in this regard. As an illustrative example, the 500‐kV transmission tower mentioned above is modeled, and it is shown that the derived model closely reproduces the FDTD simulation result. © 2008 Wiley Periodicals, Inc. Electr Eng Jpn, 164(1): 8–20, 2008; Published online in Wiley InterScience (www.interscience. wiley.com). DOI 10.1002/eej.20675 |
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Bibliography: | istex:E0F77E351FBAA86E2E2F947F58B4FCA74F8AD250 ark:/67375/WNG-ZM3T5XFM-J ArticleID:EEJ20675 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0424-7760 1520-6416 |
DOI: | 10.1002/eej.20675 |