Accurate determination of X-ray energies using powder diffraction

• Published in: Radiation physics and chemistry (Oxford, England : 1993) Vol. 75; no. 11; pp. 2063 - 2066
• Main Authors: Rae, N.A., Chantler, C.T., Tran, C.Q., Barnea, Z.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.11.2006
• Subjects: Powder diffraction; Synchrotron radiation; 41.50.+h; 07.85.Qe; Powder diffraction; Synchrotron radiation; 61.12.Nz
• ISSN: 0969-806X; 1879-0895
• DOI: 10.1016/j.radphyschem.2005.09.018

We report synchrotron energy determinations using the powder diffraction patterns of Si (640b) and LaB 6 (660) standard reference powders at a number of energies between 5 and 20 keV. The fitted peak positions of all peaks recorded on image plates were used in each energy determination. Several sources of systematic error were investigated and their connection led to physically reasonable and consistent fitting parameters. The energies were determined to better than 0.025% at all energies. Our procedure shows that the use of the accurately known lattice parameters of standard materials makes it possible to determine X-ray energies without involving the full panoply of the Rietveld technique (which involves the crystal structure, crystal perfection, particle size, preferred orientation and other parameters affecting the full powder diffraction pattern).