Charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors

•Continuous model for Symmetric Double-Gate Junctionless Transistors is proposed.•The model is physically-based for depletion and accumulation operating conditions.•The model provides an accurate description of the transistor behavior.•An analytical expression to calculate the threshold voltage was...

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Published inSolid-state electronics Vol. 85; pp. 59 - 63
Main Authors Cerdeira, A., Estrada, M., Iniguez, B., Trevisoli, R.D., Doria, R.T., de Souza, M., Pavanello, M.A.
Format Journal Article
LanguageEnglish
Published Kidlington Elsevier Ltd 01.07.2013
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Abstract •Continuous model for Symmetric Double-Gate Junctionless Transistors is proposed.•The model is physically-based for depletion and accumulation operating conditions.•The model provides an accurate description of the transistor behavior.•An analytical expression to calculate the threshold voltage was obtained.•The effect of the series resistance is included. A new charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors (SDGJLTM) is proposed and validated with simulations for doping concentrations of 5×1018 and 1×1019cm−3, as well as for layer thicknesses of 10, 15 and 20nm. The model is physically-based, considering both the depletion and accumulation operating conditions. Most model parameters are related to physical magnitudes, and the extraction procedure for each of them is well established. The model provides an accurate description of the transistor behavior in all operating conditions. Among important advantages with respect to previous models are the inclusion of the effect of the series resistance and the fulfilment of the requirement of being symmetrical with respect to Vd=0V.
AbstractList •Continuous model for Symmetric Double-Gate Junctionless Transistors is proposed.•The model is physically-based for depletion and accumulation operating conditions.•The model provides an accurate description of the transistor behavior.•An analytical expression to calculate the threshold voltage was obtained.•The effect of the series resistance is included. A new charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors (SDGJLTM) is proposed and validated with simulations for doping concentrations of 5×1018 and 1×1019cm−3, as well as for layer thicknesses of 10, 15 and 20nm. The model is physically-based, considering both the depletion and accumulation operating conditions. Most model parameters are related to physical magnitudes, and the extraction procedure for each of them is well established. The model provides an accurate description of the transistor behavior in all operating conditions. Among important advantages with respect to previous models are the inclusion of the effect of the series resistance and the fulfilment of the requirement of being symmetrical with respect to Vd=0V.
A new charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors (SDGJLTM) is proposed and validated with simulations for doping concentrations of 5 1018 and 1 1019 cm-3, as well as for layer thicknesses of 10, 15 and 20 nm. The model is physically-based, considering both the depletion and accumulation operating conditions. Most model parameters are related to physical magnitudes, and the extraction procedure for each of them is well established. The model provides an accurate description of the transistor behavior in all operating conditions. Among important advantages with respect to previous models are the inclusion of the effect of the series resistance and the fulfilment of the requirement of being symmetrical with respect to Vd = 0 V.
Author Estrada, M.
Trevisoli, R.D.
de Souza, M.
Pavanello, M.A.
Cerdeira, A.
Iniguez, B.
Doria, R.T.
Author_xml – sequence: 1
  givenname: A.
  surname: Cerdeira
  fullname: Cerdeira, A.
  email: cerdeira@cinvestav.mx
  organization: Sección de Electrónica de Estado Sólido, Depto. Ingeniería Eléctrica, CINVESTAV-IPN, México, D.F. 07360, Mexico
– sequence: 2
  givenname: M.
  surname: Estrada
  fullname: Estrada, M.
  organization: Sección de Electrónica de Estado Sólido, Depto. Ingeniería Eléctrica, CINVESTAV-IPN, México, D.F. 07360, Mexico
– sequence: 3
  givenname: B.
  surname: Iniguez
  fullname: Iniguez, B.
  organization: Departament d’Enginyeria Electrònica, Elèctrica i Automàtica, Universitat Rovira i Virgili, Av. Països Catalans, 26, Tarragona 43007, Spain
– sequence: 4
  givenname: R.D.
  surname: Trevisoli
  fullname: Trevisoli, R.D.
  organization: Department of Electrical Engineering, Centro Universitário da FEI, Av. Humberto de Alencar Castelo Branco n. 3972, 09850-901 São Bernardo do Campo, Brazil
– sequence: 5
  givenname: R.T.
  surname: Doria
  fullname: Doria, R.T.
  organization: Department of Electrical Engineering, Centro Universitário da FEI, Av. Humberto de Alencar Castelo Branco n. 3972, 09850-901 São Bernardo do Campo, Brazil
– sequence: 6
  givenname: M.
  surname: de Souza
  fullname: de Souza, M.
  organization: Department of Electrical Engineering, Centro Universitário da FEI, Av. Humberto de Alencar Castelo Branco n. 3972, 09850-901 São Bernardo do Campo, Brazil
– sequence: 7
  givenname: M.A.
  surname: Pavanello
  fullname: Pavanello, M.A.
  organization: Department of Electrical Engineering, Centro Universitário da FEI, Av. Humberto de Alencar Castelo Branco n. 3972, 09850-901 São Bernardo do Campo, Brazil
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=27391100$$DView record in Pascal Francis
BookMark eNp9kM1r3DAQxUVIIJuPPyA3Xwq9eDuy_CHTU9k2SUughyTHIGblUaLFllKNHch_Xy0beiwMDAy_94b3zsRxiIGEuJKwliDbL7s1M60rkGoNeUAfiZXUXV9WNTTHYgWgdCkzeirOmHcAULUSVuJp84LpmcotMg2FjWH2YYkLF1McaCxcTMUYw3NpXzCEfLh_nyaak7fF97hsRypvcKbi1xLs7GMYibl4SBjY8xwTX4gThyPT5cc-F4_XPx42t-Xd75ufm293pa1BzWXXbrFWGmHQTU8AtlXVgJ1qnHRWupo67IbeNareEg49NFWDgNjqRpJ2ulPn4vPB9zXFPwvxbCbPlsYRA-UwRjYqR-_qSmdUHlCbInMiZ16TnzC9GwlmX6XZmVyl2VdpIA_sNZ8-7JEtji4HtJ7_CatO9blayNzXA0c565unZNh6CpYGn8jOZoj-P1_-AlAVi9s
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ContentType Journal Article
Copyright 2013 Elsevier Ltd
2014 INIST-CNRS
Copyright_xml – notice: 2013 Elsevier Ltd
– notice: 2014 INIST-CNRS
DBID IQODW
AAYXX
CITATION
7SP
7U5
8FD
H8D
L7M
DOI 10.1016/j.sse.2013.03.008
DatabaseName Pascal-Francis
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Aerospace Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Aerospace Database
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Aerospace Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Applied Sciences
EISSN 1879-2405
EndPage 63
ExternalDocumentID 10_1016_j_sse_2013_03_008
27391100
S0038110113001524
GroupedDBID --K
--M
-~X
.DC
.~1
0R~
123
1B1
1RT
1~.
1~5
4.4
457
4G.
5VS
6TJ
7-5
71M
8P~
9JN
AABXZ
AACTN
AAEDT
AAEDW
AAEPC
AAIAV
AAIKJ
AAKOC
AALRI
AAOAW
AAQFI
AAQXK
AAXUO
ABFNM
ABFRF
ABJNI
ABMAC
ABNEU
ABTAH
ABXDB
ABXRA
ABYKQ
ACDAQ
ACFVG
ACGFO
ACGFS
ACNCT
ACNNM
ACRLP
ADBBV
ADEZE
ADMUD
ADTZH
AEBSH
AECPX
AEFWE
AEKER
AENEX
AEZYN
AFFNX
AFKWA
AFRZQ
AFTJW
AGHFR
AGUBO
AGYEJ
AHHHB
AHJVU
AIEXJ
AIKHN
AITUG
AIVDX
AJBFU
AJOXV
ALMA_UNASSIGNED_HOLDINGS
AMFUW
AMRAJ
ASPBG
AVWKF
AXJTR
AZFZN
BBWZM
BJAXD
BKOJK
BLXMC
CS3
DU5
EBS
EFJIC
EFLBG
EJD
EO8
EO9
EP2
EP3
F5P
FDB
FEDTE
FGOYB
FIRID
FNPLU
FYGXN
G-2
G-Q
G8K
GBLVA
HMV
HVGLF
HZ~
H~9
IHE
J1W
JJJVA
KOM
LY7
M24
M38
M41
MAGPM
MO0
N9A
NDZJH
O-L
O9-
OAUVE
OGIMB
OZT
P-8
P-9
P2P
PC.
PZZ
Q38
R2-
RIG
RNS
ROL
RPZ
SDF
SDG
SDP
SES
SET
SEW
SMS
SPC
SPCBC
SPD
SPG
SSM
SSQ
SST
SSZ
T5K
TAE
TN5
WH7
WUQ
XFK
XSW
ZMT
ZY4
~G-
08R
8W4
AALMO
AAPBV
ABFLS
ABPIF
ABPTK
ABQIS
ADALY
IPNFZ
IQODW
AAXKI
AAYXX
AFJKZ
AKRWK
CITATION
7SP
7U5
8FD
H8D
L7M
ID FETCH-LOGICAL-c403t-76ba438a0d859e00c632da735f1fc1f4e7a7d9f534bead90525a0aa6851e8f873
IEDL.DBID AIKHN
ISSN 0038-1101
IngestDate Fri Oct 25 04:57:22 EDT 2024
Thu Sep 26 16:09:18 EDT 2024
Thu Nov 24 18:25:55 EST 2022
Fri Feb 23 02:31:09 EST 2024
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Keywords Double-Gate Junctionless Transistor model
Depletion JLT
JLT
Accumulation JLT
Junctionless transistor
Long channel
Concentration effect
Dual gate transistor
Series resistance
Language English
License CC BY 4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c403t-76ba438a0d859e00c632da735f1fc1f4e7a7d9f534bead90525a0aa6851e8f873
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
OpenAccessLink https://www.openaccessrepository.it/record/22278/files/fulltext.pdf
PQID 1531017428
PQPubID 23500
PageCount 5
ParticipantIDs proquest_miscellaneous_1531017428
crossref_primary_10_1016_j_sse_2013_03_008
pascalfrancis_primary_27391100
elsevier_sciencedirect_doi_10_1016_j_sse_2013_03_008
PublicationCentury 2000
PublicationDate 2013-07-01
PublicationDateYYYYMMDD 2013-07-01
PublicationDate_xml – month: 07
  year: 2013
  text: 2013-07-01
  day: 01
PublicationDecade 2010
PublicationPlace Kidlington
PublicationPlace_xml – name: Kidlington
PublicationTitle Solid-state electronics
PublicationYear 2013
Publisher Elsevier Ltd
Elsevier
Publisher_xml – name: Elsevier Ltd
– name: Elsevier
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Gnani, Gnudi, Reggiani, Baccarani (b0010) 2011; 58
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Colinge JP, Lee C-W, Afzalian A, Dehdashti N, Yan R, Ferain I, et al. SOI gated resistor: CMOS without junctions, in: SOI Conference; 2009. IEEE Inter.
Cerdeira, Moldovan, Iñiguez, Estrada (b0040) 2008; 52
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Lime, Santana, Iñiguez (b0050) 2013; 80
Trevisoli, Doria, de Souza, Pavanello (b0035) 2011; 26
Duarte, Choi, Moon, Choi (b0020) 2011; 32
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Duarte (10.1016/j.sse.2013.03.008_b0020) 2011; 32
Trevisoli (10.1016/j.sse.2013.03.008_b0035) 2011; 26
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SSID ssj0002610
Score 2.2623825
Snippet •Continuous model for Symmetric Double-Gate Junctionless Transistors is proposed.•The model is physically-based for depletion and accumulation operating...
A new charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors (SDGJLTM) is proposed and validated with simulations for...
SourceID proquest
crossref
pascalfrancis
elsevier
SourceType Aggregation Database
Index Database
Publisher
StartPage 59
SubjectTerms Accumulation JLT
Applied sciences
Computer simulation
Depletion
Depletion JLT
Doping
Double-Gate Junctionless Transistor model
Electronics
Exact sciences and technology
Extraction
Inclusions
JLT
Junctionless transistor
Mathematical models
Semiconductor devices
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Transistors
Title Charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors
URI https://dx.doi.org/10.1016/j.sse.2013.03.008
https://search.proquest.com/docview/1531017428
Volume 85
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3PS8MwFH7M7aKI-BPnjxHBkxBtlzRtj2Moc6IXFXaRkKSJTLQONw9e_Nt9yVpRRA9CT4E25eX1-176Xr4HcMiQg21cOIrewyi3pktVamJqRKostxhghz5kl1dicMuHo2TUgH59FsaXVVbYP8f0gNbVyEllzZPJeOzP-CLboEf5hAyyEF-AVkgSNaHVO78YXH0CMm4SKnVG3DDhDXVyM5R5TadeLDNmldTpb_S0PFFTNJqbd7v4AdyBjc5WYaUKI0lv_qZr0LDlOix9ERfcgDufSb-31PNUQXxJ-rh8xX0-Cc1vCAar5PG5vKf-6G-JA9dvT0--vZYhGFTrR0v9jzUyRN4LWuCIiCQQW9AVmW7C7dnpTX9Aq2YK1PCIzWgqtOIsU1GRJbmNIiNYt1ApS1zsTOy4TVVa5C5hXKNz5b69nYqUEhiR2cxlKduCZvlc2m0gQmQFt1wLpQ1PND5UGxcXVrhMx1blbTiqbSgnc80MWReTPUg0uPQGlxFeUdYGXltZflt4iZj-122dbyvyORGGY7mXwWvDQb1EEr8YnwZRpUUrS8R4j0O479r539y7sNgNTTF80e4eNGcvr3YfQ5OZ7sDC8XvcqRzwAwmg5Ek
link.rule.ids 315,783,787,4511,24130,27938,27939,45599,45693
linkProvider Elsevier
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LS8QwEB50PaiI-MT1sUbwJATbTZq2RxFlH7oXFbxISNJEVrQu7u7Bf-8k24oiehB6CrQpk-n3felMZgCOGXKwjQtH0XsY5da0qUpNTI1IleUWBXboQ3Y9EJ073rtP7ufgvD4L49MqK-yfYXpA62rktLLm6Wg49Gd8kW3Qo3xABlmIz8MCqoEcnX3hrNvvDD4BGTcJVXVG3DDhDXVwM6R5jce-WGbMqlKnv9HTykiN0Whu1u3iB3AHNrpcg9VKRpKz2Zuuw5wtN2D5S3HBTXjwkfRHSz1PFcSnpA_LKe7zSWh-Q1CskufX8pH6o78lDty8v7z49lqGoKjWz5b6H2ukh7wXaoEjIpJAbKGuyHgL7i4vbs87tGqmQA2P2ISmQivOMhUVWZLbKDKCtQuVssTFzsSO21SlRe4SxjU6V-7b26lIKYGKzGYuS9k2NMrX0u4AESIruOVaKG14ovGh2ri4sMJlOrYqb8JJbUM5mtXMkHUy2ZNEg0tvcBnhFWVN4LWV5beFl4jpf93W-rYinxOhHMt9GbwmHNVLJPGL8WEQVVq0skSM9ziE-67d_819CIud2-sredUd9PdgqR0aZPgE3n1oTN6m9gBlykS3Kjf8AKg35kY
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Charge-based+continuous+model+for+long-channel+Symmetric+Double-Gate+Junctionless+Transistors&rft.jtitle=Solid-state+electronics&rft.au=CERDEIRA%2C+A&rft.au=ESTRADA%2C+M&rft.au=INIGUEZ%2C+B&rft.au=TREVISOLI%2C+R.+D&rft.date=2013-07-01&rft.pub=Elsevier&rft.issn=0038-1101&rft.eissn=1879-2405&rft.volume=85&rft.spage=59&rft.epage=63&rft_id=info:doi/10.1016%2Fj.sse.2013.03.008&rft.externalDBID=n%2Fa&rft.externalDocID=27391100
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0038-1101&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0038-1101&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0038-1101&client=summon