Charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors
•Continuous model for Symmetric Double-Gate Junctionless Transistors is proposed.•The model is physically-based for depletion and accumulation operating conditions.•The model provides an accurate description of the transistor behavior.•An analytical expression to calculate the threshold voltage was...
Saved in:
Published in | Solid-state electronics Vol. 85; pp. 59 - 63 |
---|---|
Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Kidlington
Elsevier Ltd
01.07.2013
Elsevier |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | •Continuous model for Symmetric Double-Gate Junctionless Transistors is proposed.•The model is physically-based for depletion and accumulation operating conditions.•The model provides an accurate description of the transistor behavior.•An analytical expression to calculate the threshold voltage was obtained.•The effect of the series resistance is included.
A new charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors (SDGJLTM) is proposed and validated with simulations for doping concentrations of 5×1018 and 1×1019cm−3, as well as for layer thicknesses of 10, 15 and 20nm. The model is physically-based, considering both the depletion and accumulation operating conditions. Most model parameters are related to physical magnitudes, and the extraction procedure for each of them is well established. The model provides an accurate description of the transistor behavior in all operating conditions. Among important advantages with respect to previous models are the inclusion of the effect of the series resistance and the fulfilment of the requirement of being symmetrical with respect to Vd=0V. |
---|---|
AbstractList | •Continuous model for Symmetric Double-Gate Junctionless Transistors is proposed.•The model is physically-based for depletion and accumulation operating conditions.•The model provides an accurate description of the transistor behavior.•An analytical expression to calculate the threshold voltage was obtained.•The effect of the series resistance is included.
A new charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors (SDGJLTM) is proposed and validated with simulations for doping concentrations of 5×1018 and 1×1019cm−3, as well as for layer thicknesses of 10, 15 and 20nm. The model is physically-based, considering both the depletion and accumulation operating conditions. Most model parameters are related to physical magnitudes, and the extraction procedure for each of them is well established. The model provides an accurate description of the transistor behavior in all operating conditions. Among important advantages with respect to previous models are the inclusion of the effect of the series resistance and the fulfilment of the requirement of being symmetrical with respect to Vd=0V. A new charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors (SDGJLTM) is proposed and validated with simulations for doping concentrations of 5 1018 and 1 1019 cm-3, as well as for layer thicknesses of 10, 15 and 20 nm. The model is physically-based, considering both the depletion and accumulation operating conditions. Most model parameters are related to physical magnitudes, and the extraction procedure for each of them is well established. The model provides an accurate description of the transistor behavior in all operating conditions. Among important advantages with respect to previous models are the inclusion of the effect of the series resistance and the fulfilment of the requirement of being symmetrical with respect to Vd = 0 V. |
Author | Estrada, M. Trevisoli, R.D. de Souza, M. Pavanello, M.A. Cerdeira, A. Iniguez, B. Doria, R.T. |
Author_xml | – sequence: 1 givenname: A. surname: Cerdeira fullname: Cerdeira, A. email: cerdeira@cinvestav.mx organization: Sección de Electrónica de Estado Sólido, Depto. Ingeniería Eléctrica, CINVESTAV-IPN, México, D.F. 07360, Mexico – sequence: 2 givenname: M. surname: Estrada fullname: Estrada, M. organization: Sección de Electrónica de Estado Sólido, Depto. Ingeniería Eléctrica, CINVESTAV-IPN, México, D.F. 07360, Mexico – sequence: 3 givenname: B. surname: Iniguez fullname: Iniguez, B. organization: Departament d’Enginyeria Electrònica, Elèctrica i Automàtica, Universitat Rovira i Virgili, Av. Països Catalans, 26, Tarragona 43007, Spain – sequence: 4 givenname: R.D. surname: Trevisoli fullname: Trevisoli, R.D. organization: Department of Electrical Engineering, Centro Universitário da FEI, Av. Humberto de Alencar Castelo Branco n. 3972, 09850-901 São Bernardo do Campo, Brazil – sequence: 5 givenname: R.T. surname: Doria fullname: Doria, R.T. organization: Department of Electrical Engineering, Centro Universitário da FEI, Av. Humberto de Alencar Castelo Branco n. 3972, 09850-901 São Bernardo do Campo, Brazil – sequence: 6 givenname: M. surname: de Souza fullname: de Souza, M. organization: Department of Electrical Engineering, Centro Universitário da FEI, Av. Humberto de Alencar Castelo Branco n. 3972, 09850-901 São Bernardo do Campo, Brazil – sequence: 7 givenname: M.A. surname: Pavanello fullname: Pavanello, M.A. organization: Department of Electrical Engineering, Centro Universitário da FEI, Av. Humberto de Alencar Castelo Branco n. 3972, 09850-901 São Bernardo do Campo, Brazil |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=27391100$$DView record in Pascal Francis |
BookMark | eNp9kM1r3DAQxUVIIJuPPyA3Xwq9eDuy_CHTU9k2SUughyTHIGblUaLFllKNHch_Xy0beiwMDAy_94b3zsRxiIGEuJKwliDbL7s1M60rkGoNeUAfiZXUXV9WNTTHYgWgdCkzeirOmHcAULUSVuJp84LpmcotMg2FjWH2YYkLF1McaCxcTMUYw3NpXzCEfLh_nyaak7fF97hsRypvcKbi1xLs7GMYibl4SBjY8xwTX4gThyPT5cc-F4_XPx42t-Xd75ufm293pa1BzWXXbrFWGmHQTU8AtlXVgJ1qnHRWupo67IbeNareEg49NFWDgNjqRpJ2ulPn4vPB9zXFPwvxbCbPlsYRA-UwRjYqR-_qSmdUHlCbInMiZ16TnzC9GwlmX6XZmVyl2VdpIA_sNZ8-7JEtji4HtJ7_CatO9blayNzXA0c565unZNh6CpYGn8jOZoj-P1_-AlAVi9s |
CitedBy_id | crossref_primary_10_1016_j_spmi_2015_09_041 crossref_primary_10_1016_j_sse_2017_02_004 crossref_primary_10_1088_0268_1242_31_7_075002 crossref_primary_10_1007_s10825_015_0723_z crossref_primary_10_1016_j_sse_2014_02_010 crossref_primary_10_1016_j_sse_2014_02_011 crossref_primary_10_1109_TED_2014_2340441 crossref_primary_10_1088_1361_648X_aad34f crossref_primary_10_1016_j_mejo_2016_02_003 crossref_primary_10_1088_0268_1242_30_5_055011 crossref_primary_10_1109_TED_2013_2281615 crossref_primary_10_1016_j_microrel_2016_05_006 crossref_primary_10_1109_TED_2015_2507571 crossref_primary_10_1109_TNANO_2016_2570813 crossref_primary_10_1016_j_spmi_2015_09_001 crossref_primary_10_1088_1674_4926_36_2_024001 crossref_primary_10_1007_s10825_017_1112_6 crossref_primary_10_1016_j_mssp_2015_07_060 crossref_primary_10_1016_j_sse_2015_01_020 crossref_primary_10_3390_electronics9071174 crossref_primary_10_1016_j_sse_2016_04_013 crossref_primary_10_1016_j_sse_2015_06_009 |
Cites_doi | 10.1109/LED.2011.2127441 10.1109/TED.2011.2156413 10.1016/j.sse.2007.10.046 10.1109/TED.2011.2159608 10.1109/TED.2012.2219055 10.1016/j.sse.2012.10.017 10.1109/SOI.2009.5318737 10.1088/0268-1242/26/10/105009 10.1016/j.sse.2008.03.009 |
ContentType | Journal Article |
Copyright | 2013 Elsevier Ltd 2014 INIST-CNRS |
Copyright_xml | – notice: 2013 Elsevier Ltd – notice: 2014 INIST-CNRS |
DBID | IQODW AAYXX CITATION 7SP 7U5 8FD H8D L7M |
DOI | 10.1016/j.sse.2013.03.008 |
DatabaseName | Pascal-Francis CrossRef Electronics & Communications Abstracts Solid State and Superconductivity Abstracts Technology Research Database Aerospace Database Advanced Technologies Database with Aerospace |
DatabaseTitle | CrossRef Aerospace Database Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts |
DatabaseTitleList | Aerospace Database |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Applied Sciences |
EISSN | 1879-2405 |
EndPage | 63 |
ExternalDocumentID | 10_1016_j_sse_2013_03_008 27391100 S0038110113001524 |
GroupedDBID | --K --M -~X .DC .~1 0R~ 123 1B1 1RT 1~. 1~5 4.4 457 4G. 5VS 6TJ 7-5 71M 8P~ 9JN AABXZ AACTN AAEDT AAEDW AAEPC AAIAV AAIKJ AAKOC AALRI AAOAW AAQFI AAQXK AAXUO ABFNM ABFRF ABJNI ABMAC ABNEU ABTAH ABXDB ABXRA ABYKQ ACDAQ ACFVG ACGFO ACGFS ACNCT ACNNM ACRLP ADBBV ADEZE ADMUD ADTZH AEBSH AECPX AEFWE AEKER AENEX AEZYN AFFNX AFKWA AFRZQ AFTJW AGHFR AGUBO AGYEJ AHHHB AHJVU AIEXJ AIKHN AITUG AIVDX AJBFU AJOXV ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ ASPBG AVWKF AXJTR AZFZN BBWZM BJAXD BKOJK BLXMC CS3 DU5 EBS EFJIC EFLBG EJD EO8 EO9 EP2 EP3 F5P FDB FEDTE FGOYB FIRID FNPLU FYGXN G-2 G-Q G8K GBLVA HMV HVGLF HZ~ H~9 IHE J1W JJJVA KOM LY7 M24 M38 M41 MAGPM MO0 N9A NDZJH O-L O9- OAUVE OGIMB OZT P-8 P-9 P2P PC. PZZ Q38 R2- RIG RNS ROL RPZ SDF SDG SDP SES SET SEW SMS SPC SPCBC SPD SPG SSM SSQ SST SSZ T5K TAE TN5 WH7 WUQ XFK XSW ZMT ZY4 ~G- 08R 8W4 AALMO AAPBV ABFLS ABPIF ABPTK ABQIS ADALY IPNFZ IQODW AAXKI AAYXX AFJKZ AKRWK CITATION 7SP 7U5 8FD H8D L7M |
ID | FETCH-LOGICAL-c403t-76ba438a0d859e00c632da735f1fc1f4e7a7d9f534bead90525a0aa6851e8f873 |
IEDL.DBID | AIKHN |
ISSN | 0038-1101 |
IngestDate | Fri Oct 25 04:57:22 EDT 2024 Thu Sep 26 16:09:18 EDT 2024 Thu Nov 24 18:25:55 EST 2022 Fri Feb 23 02:31:09 EST 2024 |
IsDoiOpenAccess | false |
IsOpenAccess | true |
IsPeerReviewed | true |
IsScholarly | true |
Keywords | Double-Gate Junctionless Transistor model Depletion JLT JLT Accumulation JLT Junctionless transistor Long channel Concentration effect Dual gate transistor Series resistance |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c403t-76ba438a0d859e00c632da735f1fc1f4e7a7d9f534bead90525a0aa6851e8f873 |
Notes | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
OpenAccessLink | https://www.openaccessrepository.it/record/22278/files/fulltext.pdf |
PQID | 1531017428 |
PQPubID | 23500 |
PageCount | 5 |
ParticipantIDs | proquest_miscellaneous_1531017428 crossref_primary_10_1016_j_sse_2013_03_008 pascalfrancis_primary_27391100 elsevier_sciencedirect_doi_10_1016_j_sse_2013_03_008 |
PublicationCentury | 2000 |
PublicationDate | 2013-07-01 |
PublicationDateYYYYMMDD | 2013-07-01 |
PublicationDate_xml | – month: 07 year: 2013 text: 2013-07-01 day: 01 |
PublicationDecade | 2010 |
PublicationPlace | Kidlington |
PublicationPlace_xml | – name: Kidlington |
PublicationTitle | Solid-state electronics |
PublicationYear | 2013 |
Publisher | Elsevier Ltd Elsevier |
Publisher_xml | – name: Elsevier Ltd – name: Elsevier |
References | Cerdeira, Iñiguez, Estrada (b0045) 2008; 52 Gnani, Gnudi, Reggiani, Baccarani (b0010) 2011; 58 Sallese, Chevillon, Lallement, Iñiguez, Pregaldiny (b0025) 2011; 58 Colinge JP, Lee C-W, Afzalian A, Dehdashti N, Yan R, Ferain I, et al. SOI gated resistor: CMOS without junctions, in: SOI Conference; 2009. IEEE Inter. Cerdeira, Moldovan, Iñiguez, Estrada (b0040) 2008; 52 p. 1–2. Lime, Santana, Iñiguez (b0050) 2013; 80 Trevisoli, Doria, de Souza, Pavanello (b0035) 2011; 26 Duarte, Choi, Moon, Choi (b0020) 2011; 32 Trevisoli, Doria, de Souza, Das, Ferain nad, Pavanello (b0015) 2012 Duarte (10.1016/j.sse.2013.03.008_b0020) 2011; 32 Trevisoli (10.1016/j.sse.2013.03.008_b0035) 2011; 26 Cerdeira (10.1016/j.sse.2013.03.008_b0045) 2008; 52 10.1016/j.sse.2013.03.008_b0005 Trevisoli (10.1016/j.sse.2013.03.008_b0015) 2012 Sallese (10.1016/j.sse.2013.03.008_b0025) 2011; 58 Lime (10.1016/j.sse.2013.03.008_b0050) 2013; 80 Gnani (10.1016/j.sse.2013.03.008_b0010) 2011; 58 Cerdeira (10.1016/j.sse.2013.03.008_b0040) 2008; 52 |
References_xml | – volume: 58 start-page: 2903 year: 2011 end-page: 2910 ident: b0010 article-title: Theory of the junctionless nanowire FET publication-title: IEEE Trans Electron Dev contributor: fullname: Baccarani – volume: 52 start-page: 830 year: 2008 end-page: 837 ident: b0040 article-title: Modeling of potentials and threshold voltage for symmetric doped double-gate MOSFETs publication-title: Solid-State Electron contributor: fullname: Estrada – volume: 80 start-page: 28 year: 2013 end-page: 32 ident: b0050 article-title: A simple compact model for long-channel junctionless double-gate MOSFETs publication-title: Solid-State Electron contributor: fullname: Iñiguez – volume: 32 start-page: 704 year: 2011 end-page: 706 ident: b0020 article-title: Simple analytical bulk current model for long-channel double-gate junctionless transistors publication-title: IEEE Electron Dev Lett contributor: fullname: Choi – volume: 26 start-page: 105009 year: 2011 ident: b0035 article-title: Threshold voltage in junctionless nanowire transistors publication-title: Semicond Sci Technol contributor: fullname: Pavanello – year: 2012 ident: b0015 article-title: Surface-potential-based drain current analytical model for triple-gate junctionless nanowire transistors publication-title: IEEE Trans Electron Dev contributor: fullname: Pavanello – volume: 58 start-page: 2628 year: 2011 end-page: 2637 ident: b0025 article-title: Charge-based modeling of junctionless double-gate field-effect transistors publication-title: IEEE Trans Electron Dev contributor: fullname: Pregaldiny – volume: 52 start-page: 1064 year: 2008 end-page: 1070 ident: b0045 article-title: Compact model for short channel symmetric doped double-gate MOSFETs publication-title: Solid-State Electron contributor: fullname: Estrada – volume: 32 start-page: 704 year: 2011 ident: 10.1016/j.sse.2013.03.008_b0020 article-title: Simple analytical bulk current model for long-channel double-gate junctionless transistors publication-title: IEEE Electron Dev Lett doi: 10.1109/LED.2011.2127441 contributor: fullname: Duarte – volume: 58 start-page: 2628 year: 2011 ident: 10.1016/j.sse.2013.03.008_b0025 article-title: Charge-based modeling of junctionless double-gate field-effect transistors publication-title: IEEE Trans Electron Dev doi: 10.1109/TED.2011.2156413 contributor: fullname: Sallese – volume: 52 start-page: 830 year: 2008 ident: 10.1016/j.sse.2013.03.008_b0040 article-title: Modeling of potentials and threshold voltage for symmetric doped double-gate MOSFETs publication-title: Solid-State Electron doi: 10.1016/j.sse.2007.10.046 contributor: fullname: Cerdeira – volume: 58 start-page: 2903 year: 2011 ident: 10.1016/j.sse.2013.03.008_b0010 article-title: Theory of the junctionless nanowire FET publication-title: IEEE Trans Electron Dev doi: 10.1109/TED.2011.2159608 contributor: fullname: Gnani – year: 2012 ident: 10.1016/j.sse.2013.03.008_b0015 article-title: Surface-potential-based drain current analytical model for triple-gate junctionless nanowire transistors publication-title: IEEE Trans Electron Dev doi: 10.1109/TED.2012.2219055 contributor: fullname: Trevisoli – volume: 80 start-page: 28 year: 2013 ident: 10.1016/j.sse.2013.03.008_b0050 article-title: A simple compact model for long-channel junctionless double-gate MOSFETs publication-title: Solid-State Electron doi: 10.1016/j.sse.2012.10.017 contributor: fullname: Lime – ident: 10.1016/j.sse.2013.03.008_b0005 doi: 10.1109/SOI.2009.5318737 – volume: 26 start-page: 105009 year: 2011 ident: 10.1016/j.sse.2013.03.008_b0035 article-title: Threshold voltage in junctionless nanowire transistors publication-title: Semicond Sci Technol doi: 10.1088/0268-1242/26/10/105009 contributor: fullname: Trevisoli – volume: 52 start-page: 1064 year: 2008 ident: 10.1016/j.sse.2013.03.008_b0045 article-title: Compact model for short channel symmetric doped double-gate MOSFETs publication-title: Solid-State Electron doi: 10.1016/j.sse.2008.03.009 contributor: fullname: Cerdeira |
SSID | ssj0002610 |
Score | 2.2623825 |
Snippet | •Continuous model for Symmetric Double-Gate Junctionless Transistors is proposed.•The model is physically-based for depletion and accumulation operating... A new charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors (SDGJLTM) is proposed and validated with simulations for... |
SourceID | proquest crossref pascalfrancis elsevier |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 59 |
SubjectTerms | Accumulation JLT Applied sciences Computer simulation Depletion Depletion JLT Doping Double-Gate Junctionless Transistor model Electronics Exact sciences and technology Extraction Inclusions JLT Junctionless transistor Mathematical models Semiconductor devices Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Transistors |
Title | Charge-based continuous model for long-channel Symmetric Double-Gate Junctionless Transistors |
URI | https://dx.doi.org/10.1016/j.sse.2013.03.008 https://search.proquest.com/docview/1531017428 |
Volume | 85 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3PS8MwFH7M7aKI-BPnjxHBkxBtlzRtj2Moc6IXFXaRkKSJTLQONw9e_Nt9yVpRRA9CT4E25eX1-176Xr4HcMiQg21cOIrewyi3pktVamJqRKostxhghz5kl1dicMuHo2TUgH59FsaXVVbYP8f0gNbVyEllzZPJeOzP-CLboEf5hAyyEF-AVkgSNaHVO78YXH0CMm4SKnVG3DDhDXVyM5R5TadeLDNmldTpb_S0PFFTNJqbd7v4AdyBjc5WYaUKI0lv_qZr0LDlOix9ERfcgDufSb-31PNUQXxJ-rh8xX0-Cc1vCAar5PG5vKf-6G-JA9dvT0--vZYhGFTrR0v9jzUyRN4LWuCIiCQQW9AVmW7C7dnpTX9Aq2YK1PCIzWgqtOIsU1GRJbmNIiNYt1ApS1zsTOy4TVVa5C5hXKNz5b69nYqUEhiR2cxlKduCZvlc2m0gQmQFt1wLpQ1PND5UGxcXVrhMx1blbTiqbSgnc80MWReTPUg0uPQGlxFeUdYGXltZflt4iZj-122dbyvyORGGY7mXwWvDQb1EEr8YnwZRpUUrS8R4j0O479r539y7sNgNTTF80e4eNGcvr3YfQ5OZ7sDC8XvcqRzwAwmg5Ek |
link.rule.ids | 315,783,787,4511,24130,27938,27939,45599,45693 |
linkProvider | Elsevier |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1LS8QwEB50PaiI-MT1sUbwJATbTZq2RxFlH7oXFbxISNJEVrQu7u7Bf-8k24oiehB6CrQpk-n3felMZgCOGXKwjQtH0XsY5da0qUpNTI1IleUWBXboQ3Y9EJ073rtP7ufgvD4L49MqK-yfYXpA62rktLLm6Wg49Gd8kW3Qo3xABlmIz8MCqoEcnX3hrNvvDD4BGTcJVXVG3DDhDXVwM6R5jce-WGbMqlKnv9HTykiN0Whu1u3iB3AHNrpcg9VKRpKz2Zuuw5wtN2D5S3HBTXjwkfRHSz1PFcSnpA_LKe7zSWh-Q1CskufX8pH6o78lDty8v7z49lqGoKjWz5b6H2ukh7wXaoEjIpJAbKGuyHgL7i4vbs87tGqmQA2P2ISmQivOMhUVWZLbKDKCtQuVssTFzsSO21SlRe4SxjU6V-7b26lIKYGKzGYuS9k2NMrX0u4AESIruOVaKG14ovGh2ri4sMJlOrYqb8JJbUM5mtXMkHUy2ZNEg0tvcBnhFWVN4LWV5beFl4jpf93W-rYinxOhHMt9GbwmHNVLJPGL8WEQVVq0skSM9ziE-67d_819CIud2-sredUd9PdgqR0aZPgE3n1oTN6m9gBlykS3Kjf8AKg35kY |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Charge-based+continuous+model+for+long-channel+Symmetric+Double-Gate+Junctionless+Transistors&rft.jtitle=Solid-state+electronics&rft.au=CERDEIRA%2C+A&rft.au=ESTRADA%2C+M&rft.au=INIGUEZ%2C+B&rft.au=TREVISOLI%2C+R.+D&rft.date=2013-07-01&rft.pub=Elsevier&rft.issn=0038-1101&rft.eissn=1879-2405&rft.volume=85&rft.spage=59&rft.epage=63&rft_id=info:doi/10.1016%2Fj.sse.2013.03.008&rft.externalDBID=n%2Fa&rft.externalDocID=27391100 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0038-1101&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0038-1101&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0038-1101&client=summon |