Structural and magnetic characterization of martensitic Ni–Mn–Ga thin films deposited on Mo foil

Three martensitic Ni 51.4Mn 28.3Ga 20.3 thin films sputter-deposited on a Mo foil were investigated with regard to their crystal and magnetic domain structures, as well as their magnetic and magnetostrain properties. The film thicknesses, d, were 0.1, 0.4 and 1.0μm. X-ray and electron diffraction pa...

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Bibliographic Details
Published inActa materialia Vol. 54; no. 20; pp. 5461 - 5467
Main Authors Chernenko, V.A., Anton, R. Lopez, Kohl, M., Barandiaran, J.M., Ohtsuka, M., Orue, I., Besseghini, S.
Format Journal Article
LanguageEnglish
Published Oxford Elsevier Ltd 01.12.2006
Elsevier Science
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