Structural and magnetic characterization of martensitic Ni–Mn–Ga thin films deposited on Mo foil
Three martensitic Ni 51.4Mn 28.3Ga 20.3 thin films sputter-deposited on a Mo foil were investigated with regard to their crystal and magnetic domain structures, as well as their magnetic and magnetostrain properties. The film thicknesses, d, were 0.1, 0.4 and 1.0μm. X-ray and electron diffraction pa...
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Published in | Acta materialia Vol. 54; no. 20; pp. 5461 - 5467 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Oxford
Elsevier Ltd
01.12.2006
Elsevier Science |
Subjects | |
Online Access | Get full text |
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