X-ray nanointerferometer based on si refractive bilenses

We report a novel type of x-ray interferometer employing a bilens system consisting of two parallel compound refractive lenses, each of which creates a diffraction limited beam under coherent illumination. By closely overlapping such coherent beams, an interference field with a fringe spacing rangin...

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Bibliographic Details
Published inPhysical review letters Vol. 103; no. 6; p. 064801
Main Authors Snigirev, A, Snigireva, I, Kohn, V, Yunkin, V, Kuznetsov, S, Grigoriev, M B, Roth, T, Vaughan, G, Detlefs, C
Format Journal Article
LanguageEnglish
Published United States 07.08.2009
Subjects
Interferometry - instrumentation
Interferometry - methods
Nanotechnology - instrumentation
Nanotechnology - methods
X-Rays
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Summary:We report a novel type of x-ray interferometer employing a bilens system consisting of two parallel compound refractive lenses, each of which creates a diffraction limited beam under coherent illumination. By closely overlapping such coherent beams, an interference field with a fringe spacing ranging from tens of nanometers to tens of micrometers is produced. In an experiment performed with 12 keV x rays, submicron fringes were observed by scanning and moiré imaging of the test grid. The far field interference pattern was used to characterize the x-ray coherence. Our technique opens up new opportunities for studying natural and man-made nanoscale materials.
ISSN:0031-9007
DOI:10.1103/physrevlett.103.064801