A simple X-ray standing wave technique for surface structure determination - theory and an application

• Published in: Surface science Vol. 195; no. 1; pp. 237 - 254
• Main Authors: Woodruff, D.P., Seymour, D.L., McConville, C.F., Riley, C.E., Crapper, M.D., Prince, N.P., Jones, Robert G.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 1988
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/0039-6028(88)90794-7

A modification of the usual X-ray standing wave technique for adsorbate structure determination is described which is applicable not only to highly perfect semiconductor surfaces but also to normal metal crystals having substantial mosaicity. The method, which relies on normal incidence Bragg reflection, also places weak demands on the energy resolution and degree of collimation of the X-ray beam and is appropriate for existing synchroton radiation beam lines designed for surface EXAFS and photoelectron diffraction. Experimental data show the Auger detection mode is to be preferred to photoelectron or total yield, and an analysis of the Cu(111)(√3 × √3) R30°-Cl structure yields a Cl to bulk Cu layer spacing of 1.81 ± 0.05 Å, consistent with a previous SEXAFS and photoelectron diffraction study of this surface.