Effect of sinusoidal waveform and frequency on space charge characteristics of polyimide

The charge phenomena under sine and half‐wave sine voltages within the frequency range of 500 Hz are studied here. Based on the pulsed electro‐acoustic method, the traditional circuit design under high‐frequency voltages is first analysed. It is found that the selection of a 186 pF protection capaci...

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Bibliographic Details
Published inHigh voltage Vol. 6; no. 5; pp. 760 - 769
Main Authors Ren, Hanwen, Tanaka, Yasuhiro, Miyake, Hiroaki, Li, Qingmin, Gao, Haoyu, Li, Chengqian, Wang, Zhongdong
Format Journal Article
LanguageEnglish
Published Beijing John Wiley & Sons, Inc 01.10.2021
Wiley
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Summary:The charge phenomena under sine and half‐wave sine voltages within the frequency range of 500 Hz are studied here. Based on the pulsed electro‐acoustic method, the traditional circuit design under high‐frequency voltages is first analysed. It is found that the selection of a 186 pF protection capacitor and a 333 kΩ protection resistor can ensure that the actual voltage applied to the sample is consistent with the expected input. Based on this design, experimental results show that the polarity of the charge accumulated in the depth of the sample is determined by that of the upper electrode. Comparison results under special voltages with different amplitudes and frequencies indicate that the amount of accumulated charge under sine voltages are larger than those under positive and negative half‐wave sine and DC conditions, and the samples under lower‐frequency conditions show more charge accumulation. The maximum electric field strengths appear at 90 and 270 degrees of the sine voltage with a frequency of 10 Hz, and their values are 68.55 and 81.82 kV/mm, respectively. Therefore, the charge characteristics are easily affected by the voltage’s waveform and frequency parameters. The results obtained here can provide guidance for the application of insulating materials under special voltage environments.
Bibliography:Associate Editor: Jin Li
ISSN:2397-7264
2397-7264
DOI:10.1049/hve2.12108