X-ray reflectivity study of fine structure of thin polymer films and polymer assembly at interface

• Published in: Physica. B, Condensed matter Vol. 248; no. 1; pp. 280 - 283
• Main Authors: Yamaoka, H, Matsuoka, H, Kago, K, Endo, H, Eckelt, J
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.06.1998; Elsevier
• Subjects: Applied sciences; Chemistry; Exact sciences and technology; General and physical chemistry; Langmuir blodgett films; Organic polymers; Phospholipid monolayer; Physicochemistry of polymers; Properties and characterization; Structure, morphology and analysis; Surface physical chemistry; Thin polymer film; X-ray reflectivity; Phospholipid monolayer; X-ray reflectivity; Thin polymer film; Polyvinylalcohol; X ray reflection; Multilayer; Phosphatidylcholine; Phospholipid; Langmuir Blodgett layer; Experimental study; Thin film; Surface structure
• ISSN: 0921-4526; 1873-2135
• DOI: 10.1016/S0921-4526(98)00249-X

For the purpose of studying the surfaces of both thin films and monolayers on water surface, an apparatus for X-ray reflectometry (XR) has been newly constructed by modification of a theta–theta goniometer. At the sample position, the specially designed LB trough was set for water surface measurements. In the case of a thin poly(vinyl alcohol) film on a glass plate prepared by the spin-coating method, a lot of sharp and clear Kiessig fringes (at least 34th) are observed, indicating an extremely high resolution of our XR apparatus. Similar experiments were also performed for thin multilayer films composed of different kinds of polymers, and the fine structures of these films were precisely determined. XR profiles of distearoylphosphatidylcholine (DSPC), a phospholipid, monolayer on water surface were measured at three different surface pressures. The fringe positions shifted towards the lower angle direction with increasing surface pressure, indicating that the monolayer thickness increases with the increase of surface pressure.