Multiple integration method for a high signal-to-noise ratio readout integrated circuit
A multiple integration method is reported that greatly improves the signal-to-noise ratio (SNR) for applications with a high-resolution infrared (IR) focal plane array. The signal from each pixel is repeatedly sampled into an integration capacitor and then output and summed into an outside memory th...
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Published in | IEEE transactions on circuits and systems. II, Express briefs Vol. 52; no. 9; pp. 553 - 557 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.09.2005
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | A multiple integration method is reported that greatly improves the signal-to-noise ratio (SNR) for applications with a high-resolution infrared (IR) focal plane array. The signal from each pixel is repeatedly sampled into an integration capacitor and then output and summed into an outside memory that continues for n read cycles during each period of a frame. This method increases the effective capacity of the charge integration and improves sensitivity. Because a low-noise function block and high-speed operation of the readout circuit is required, a new concept is proposed that enables the readout circuit to perform digitization by a voltage skimming method. The readout circuit was fabricated using a 0.6-/spl mu/m CMOS process for a 64/spl times/64 midwavelength IR HgCdTe detector array. The readout circuit effectively increases the charge storage capacity to 2.4/spl times/10/sup 8/ electrons and then provides a greatly improved SNR by a factor of approximately 3. |
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ISSN: | 1549-7747 1558-3791 |
DOI: | 10.1109/TCSII.2005.848984 |