Evaluation of C60 secondary ion mass spectrometry for the chemical analysis and imaging of fingerprints

• Published in: Forensic science international Vol. 231; no. 1; pp. 263 - 269
• Main Authors: Sisco, Edward, Demoranville, Leonard T, Gillen, Greg
• Format: Journal Article
• Language: English
• Published: Ireland Elsevier Ireland Ltd 10.09.2013; Elsevier Limited
• Subjects: Analytical chemistry; Biometrics; Buckminsterfullerene; Chemical analysis; Chemical imaging; Cholesterol - analysis; Dermatoglyphics; Explosives; Fatty acids; Fatty Acids - analysis; Feasibility Studies; Fingerprints; Forensic sciences; Fullerenes; Fullerenes - chemistry; Humans; Image Processing, Computer-Assisted; Ion beams; Ion bombardment; Ions; Latent fingerprint; Mass spectrometry; Monitors; Pathology; Position (location); Quaternary Ammonium Compounds - analysis; Secondary ion mass spectrometry; Software; Spectrometry, Mass, Secondary Ion; Squalene - analysis; Chemical imaging; Secondary ion mass spectrometry; Latent fingerprint
• ISSN: 0379-0738; 1872-6283
• DOI: 10.1016/j.forsciint.2013.05.026

Abstract The feasibility of using C60+ cluster primary ion bombardment secondary ion mass spectrometry (C60+ SIMS) for the analysis of the chemical composition of fingerprints is evaluated. It was found that C60+ SIMS could be used to detect and image the spatial localization of a number of sebaceous and eccrine components in fingerprints. These analyses were also found to not be hindered by the use of common latent print powder development techniques. Finally, the ability to monitor the depth distribution of fingerprint constituents was found to be possible – a capability which has not been shown using other chemical imaging techniques. This paper illustrates a number of strengths and potential weaknesses of C60+ SIMS as an additional or complimentary technique for the chemical analysis of fingerprints.