Dependences of contraction/expansion of stacking faults on temperature and current density in 4H-SiC p-i-n diodes

To investigate the mechanism of contraction/expansion behavior of Shockley stacking faults (SSFs) in 4H-SiC p-i-n diodes, the dependences of the SSF behavior on temperature and injection current density were investigated by electroluminescence image observation. We investigated the dependences of bo...

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 57; no. 6; pp. 61301 - 61306
Main Authors Okada, Aoi, Nishio, Johji, Iijima, Ryosuke, Ota, Chiharu, Goryu, Akihiro, Miyazato, Masaki, Ryo, Mina, Shinohe, Takashi, Miyajima, Masaaki, Kato, Tomohisa, Yonezawa, Yoshiyuki, Okumura, Hajime
Format Journal Article
LanguageEnglish
Published Tokyo The Japan Society of Applied Physics 01.06.2018
Japanese Journal of Applied Physics
Subjects
Current density
Electroluminescence
Injection current
PIN diodes
Stacking faults
Temperature dependence
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Summary:To investigate the mechanism of contraction/expansion behavior of Shockley stacking faults (SSFs) in 4H-SiC p-i-n diodes, the dependences of the SSF behavior on temperature and injection current density were investigated by electroluminescence image observation. We investigated the dependences of both triangle- and bar-shaped SSFs on the injection current density at four temperature levels. All SSFs in this study show similar temperature and injection current density dependences. We found that the expansion of SSFs at a high current density was converted to contraction at a certain value as the current decreased and that the value is temperature-dependent. It has been confirmed that SSF behavior, which was considered complex or peculiar, might be explained mainly by the energy change caused by SSFs.
ISSN:0021-4922
1347-4065
DOI:10.7567/JJAP.57.061301