Yb growth on Ni(100) studied by XPS inelastic background analysis

• Published in: Surface science Vol. 236; no. 3; pp. 271 - 281
• Main Authors: Tougaard, S., Hansen, H.S.
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier B.V 01.10.1990; Amsterdam Elsevier Science; New York, NY
• Subjects: Applied sciences; Condensed matter: structure, mechanical and thermal properties; Exact sciences and technology; Metals. Metallurgy; Physics; Solid surfaces and solid-solid interfaces; Surface and interface dynamics and vibrations; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Crystal growth; Lanthanide; Annealing; Lanthanides; Ytterbium; Photoelectron emission; Crystal face; Transition metal; Nickel; X ray; Experimental study; Thin film
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/0039-6028(90)90474-M

A recently proposed formalism for quantitative analysis of surface electron spectra is applied to an XPS study of Yb growth on a Ni(100) surface. It is found that this formalism can, by a simple analysis of a single electron spectrum, provide detailed information on the in-depth profile composition within the surface region of the sample. The uncertainty in the analysis is also investigated. Yb growth is found to proceed by a Stranski-Krastanov growth mode. Island formation is found after an ~ 9 Å Yb overlayer thickness. Sample annealing at 400°C results in the formation of an alloy in the surface region with the approximate composition Ni 0.75Yb 0.25.