Resolution of the photon scanning tunneling microscope: influence of physical parameters

• Published in: Ultramicroscopy Vol. 42; no. A; pp. 422 - 429
• Main Authors: de Fornel, F., Salomon, L., Adam, P., Bourillot, E., Goudonnet, J.P., Nevière, M.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.07.1992; Elsevier Science
• Subjects: Exact sciences and technology; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy; Physics; Photon scanning tunneling microscope
• ISSN: 0304-3991; 1879-2723
• DOI: 10.1016/0304-3991(92)90302-Z

The photon scanning tunneling microscope (PSTM) is the photon analogue of the electron scanning tunneling microscope (ESTM). It uses the evanescent field due to total internal reflection (TIR) of a light beam in a prism modulated by a sample placed on the base of the prism. Our experimental results shown details which present a lateral size as small as 200 Å. The PSTM axial resolution is more difficult to evaluate. It is a function of the roughness of the sample. For very smooth samples, images shown an axial resolution of about 10 Å. At last we discuss how both lateral and axial resolution can be affected by several parameters such as the tip surface distance and the roughness of the sample itself. This paper shows the necessity to find for each sample a good working distance where the profile follows as close as possible the shape of the sample.